International Business Machines Corporation

Jeonghee Shin

Pradip Bose

Victor V Zyuban

Minsik Cho

Brian R Konigsburg

John A Darringer

Alper Buyuktosunoglu

Haoxing Ren

Moinuddin K Qureshi

Indira Nair

Karthick Rajamani

Jon Alfred Casey

Charles Robert Lefurgy

Malcolm Scott Allen-Ware

Thomas Anthony Wassick

Alan J Drake

Jude A Rivers

Sungjun Chun

Zhigang Hu

A low level virtual machine (LLVM)-based system C compiler for architecture synthesis is provided. In one aspect, a method for translating a system C model to hardware description language (HDL) is provided. The method includes the steps of: generating a hardware connection model (HCM) from the system C model, wherein the HCM defines modules and interconnects in a hardware system; parsing the system C model into a LLVM intermediate representation (IR); converting the LLVM IR to a system LLVM IR which records correspondence information between the LLVM IR and the HCM; and generating the HDL based on direct mapping of processes from the system LLVM IR and the HCM.

LLVM-based system C compiler for architecture synthesis

A graph is constructed, having a plurality of nodes representing a plurality of logical operations and a plurality of edges connecting those of the plurality of nodes which do not conflict. A weight, including a width difference between end nodes of each of the edges, is assigned to each edge. Weighted cliques are enumerated, each including at least two of the nodes. Each of the weighted cliques is replaced with a single one of the logical operations and a multiplexer, to obtain a plurality of multiplexer-operation groups, such that each logical operation in one of the multiplexer-operation groups can be shared within a same clock cycle of a digital electronic integrated circuit.

In-cycle resource sharing for high-level synthesis of microprocessors

In a computing system running an environment for designing operation of circuitry, at least the following are performed for providing simulations and evaluations of one or more user-defined modules of circuitry including one or more pipeline stages in a pipeline. A model of the pipeline is automatically generated by using a pipeline block diagram, where the model is generated in a high-level modeling language able to perform simulations of circuitry with the pipeline. An interface is automatically generated between the one or more user-defined modules and the generated model of the pipeline, the interface including access to the pipeline, wherein the pipeline access allows the one or more user-defined modules to interact indirectly. Evaluation is performed of the one or more user-defined modules using the automatically generated model of the pipeline and the automatically generated interface. Methods, apparatus, and computer program products are disclosed.

Automating a microarchitecture design exploration environment

In a computing system running an environment for designing operation of circuity, at least the following are performed for providing simulations and evaluations of one or more user-defined modules of circuitry including one or more pipeline stages in a pipeline. A model of the pipeline is automatically generated by using a pipeline block diagram, where the model is generated in a high-level modeling language able to perform simulations of circuitry with the pipeline. An interface is automatically generated between the one or more user-defined modules and the generated model of the pipeline, the interface including a set of access methods to the pipeline. Evaluation is performed of the one or more user-defined modules using the automatically generated model of the pipeline and the automatically generated interface. Methods, apparatus, and computer program products are disclosed.

A mechanism is provided for determining a modeled age of a set of interconnect groups in a set of cores in a set of multi-core processors. For each interconnect group in the set of interconnect groups in the set of cores on the set of multi-core processors, a determination is made of a current modeled age of the interconnect group. A determination is then made as to whether at least one current modeled age of the interconnect group for the set of interconnect groups is greater than an end-of-life value. Responsive to at least one current modeled age of the interconnect group being greater than the end-of-life value, an indication to take corrective action with the at least one associated interconnect group is sent.

Managing interconnect electromigration effects

In a computing system running an environment for designing operation of circuitry, at least the following are performed for providing simulations and evaluations of one or more user-defined modules of circuitry including one or more pipeline stages in a pipeline. A model of the pipeline is automatically generated by using a pipeline block diagram, where the model is generated in a high-level modeling language able to perform simulations of circuitry with the pipeline. An interface is automatically generated between the one or more user-defined modules and the generated model of the pipeline, the interface including a set of access methods to the pipeline. Evaluation is performed of the one or more user-defined modules using the automatically generated model of the pipeline and the automatically generated interface. Methods, apparatus, and computer program products are disclosed.

A dynamic system coupled with 'pre-Silicon' design methodologies and 'post-Silicon' current optimizing programming methodologies to improve and optimize current delivery into a chip, which is limited by the physical properties of the connections (e.g., Controlled Collapse Chip Connection or C4s). The mechanism consists of measuring or estimating power consumption at a certain granularity within a chip, converting the power information into C4 current information using a method, and triggering throttling mechanisms (including token based throttling) where applicable to limit the current delivery per C4 beyond pre-established limits or periods. Design aids are used to allocate C4s throughout the chip based on the current delivery requirements. The system coupled with design and programming methodologies improve and optimize current delivery is extendable to connections across layers in a multilayer 3D chip stack.

Adaptive workload based optimizations coupled with a heterogeneous current-aware baseline design to mitigate current delivery limitations in integrated circuits

Current-aware floorplanning to overcome current delivery limitations in integrated circuits

A system and method for improving and optimizing current delivery into a chip, which is limited by the physical properties of the connections (e.g., Controlled Collapse Chip Connection or C4s). The system and method enables rapid C4 bump current estimation and placement including generating a one-time computed sensitivity matrix that includes all of the contributions of macros (or groups of components) to C4 current. The system and method further enables the calculation of a C4 current changes using the one-time computed sensitivity matrix and redistributed currents due to deletion of one or more C4 connectors. The system coupled with design and programming methodologies improve and optimize current delivery is extendable to connections across layers in a multilayer 3D chip stack.

Automating current-aware integrated circuit and package design and optimization

A system and method of operating an integrated circuit (IC) having a fixed layout of one or more blocks having one or more current sources therein that draw electrical current from a power source. The method includes dynamically issuing to a block configured to perform operations responsive to an instruction received at the block, a reserve amount of tokens; determining for each issuance of instruction to the block whether that block's reserve token amount exceeds zero; and one of: issuing the instruction to the block if the token reserve for that block is greater than one, and decrementing, after issuance of the instruction, by one token the block's reserve token amount, or, preventing issuance of an instruction to the block. In the method, each block may be initialized to have: a reserve token amount of zero, a token expiration period; a token generation cycle and a token generation amount.

Token-based current control to mitigate current delivery limitations in integrated circuits

Adaptive workload based optimizations to mitigate current delivery limitations in integrated circuits

A method for extending lifetime reliability of CMOS circuitry includes coupling a first switching device between a logic high supply rail/logic low supply rail, and coupling a virtual supply rail to the CMOS circuitry. In a first mode of operation the first switching device supplies the full voltage value between the logic high supply rail and the logic low supply rail, and in a second mode of operation, the first switching device isolates the virtual supply rail from the logic high supply rail/logic low supply rail, thereby reducing the voltage supplied to the CMOS circuitry. A second switching device is coupled between the virtual supply rail and the logic low supply rail/logic high supply rail, wherein in a third mode of operation, the voltage on the virtual supply rail and the logic low supply rail/logic high supply rail is equalized.

Method for extending lifetime reliability of digital logic devices through removal of aging mechanisms

A method for extending lifetime reliability of CMOS circuitry includes configuring a logic high supply rail, a logic low supply rail, and a virtual supply rail. In an intense recovery mode of operation, a first switching device is rendered nonconductive to isolate the virtual supply rail from the one of the logic high supply rail and the logic low supply rail, and the second switching device is rendered conductive so as to equalize the voltage on the virtual supply rail and the other of the logic high supply rail and the logic low supply rail. At least one device within the circuitry provides one of the logic high voltage and the logic low voltage to a gate terminal of an FET within the circuitry, with a source terminal of the FET coupled to the virtual supply rail, such that the FET is subjected to a reverse bias condition.

Method for extending lifetime reliability of digital logic devices through reversal of aging mechanisms

A method of predicting the lifetime reliability of an integrated circuit device with respect to one or more failure mechanisms includes breaking down the integrated circuit device into structures; breaking down each structure into elements and devices; evaluating each device to determine whether the device is vulnerable to the failure mechanisms and eliminating devices determined not to be vulnerable; estimating, for each determined vulnerable device, the impact of a failure of the device on the functionality of the specific element associated therewith, and classifying the failure into a fatal failure or a non-fatal failure, wherein a fatal failure causes the element employing the given device to fail; determining, for those devices whose failures are fatal, an effective stress degree and/or time; determining one or more of a failure rate and a probability of fatal failure for the devices, and aggregating the same across the structures and the failure mechanisms.

Method of predicting microprocessor lifetime reliability using architecture-level structure-aware techniques

An apparatus for extending lifetime reliability of CMOS circuitry includes a first switching device between a logic high supply rail/logic low supply rail, and a virtual supply rail coupled to the CMOS circuitry. In a first mode of operation the first switching device supplies the full voltage value between the logic high supply rail and the logic low supply rail, and in a second mode of operation, the first switching device isolates the virtual supply rail from the logic high supply rail/logic low supply rail, thereby reducing the voltage supplied to the CMOS circuitry. A second switching device coupled between the virtual supply rail and the logic low supply rail/logic high supply rail, in a third mode of operation, equalizes the voltage on the virtual supply rail and the logic low supply rail/logic high supply rail.

Growing community of inventors

Millwood, NY, United States of America

Jeonghee Shin