Samsung Electronics Co., Ltd.

Korea Railroad Research Institute

Krri

Jeong Min Jo

Jin Ho Lee

Kwan Sup Lee

Jung Youl Lim

Min Hwan Ok

Chang Young Lee

Su Yong Choi

Jae Heon Choe

Jae Hoon Kim

Yoo Hwan Kim

Sang Woo Pae

Jung Tae Lee

Sung Hwa Lee

Eun Jeong Jang

Hye Won Shim

Yong Jun Jang

Lee Hyeon Kim

Young Jun Jang

Provided is a hypertube transport system. Specifically, provided are a magnetically-levitated train and an infrastructure-system in which same travels, comprising: refrigerant for cooling compressed air of a hypertube train, and a compressed air cooling system utilizing the refrigerant; an apparatus and method for controlling trains operating in a vacuum tube; superconducting switches for superconducting magnets for magnetic levitation; a driving stability apparatus for the hypertube transport system; a control apparatus for trains of the hypertube transport system; and an energy harvester.

Hypertube transport system

A tube infrastructure includes a first tube; a second tube that is coupled to the first tube; and a fluid tank that is disposed to surround a coupling region of the first tube and the second tube and is filled with a fluid to seal the coupling region, wherein the fluid tank allows negative pressure to be maintained inside the first tube and the second tube.

Tube infrastructure with vacuum pressure

A method for predicting a failure rate of a semiconductor integrated circuit includes receiving a circuit netlist corresponding to circuit defining data, which defines a connection relation, input, output, size, type and operating temperature of each transistor of a plurality of transistors included in the semiconductor integrated circuit. Low-risk transistors having a low-failure probability among the plurality of transistors are detected and filtered out based on the circuit netlist. Failure rates are calculated of respective high-risk transistors other than the low-risk transistors among the plurality of transistors. A total failure rate of the semiconductor integrated circuit is calculated based on the failure rates of the respective high-risk transistors.

Method and device for predicting reliability failure rate of semiconductor integrated circuit and method of manufacturing the semiconductor integrated circuit

A test apparatus and a method for controlling the same are provided. The test apparatus may receive information about a reaction device, information about a storage environment, and external environment information from a storage storing a sample and a sensor sensing the external environment of the test apparatus. The test apparatus may perform a variety of control actions for testing the sample based on a temperature of and around the reaction device, resulting in increased reliability of the test result.

Method for controlling a test apparatus in response to external room conditions and reaction device storage conditions

Growing community of inventors

Suwon-si, South Korea

Jeong Min Jo