Samsung Electronics Co., Ltd.

Nanofocus Inc.

Jeong Hoi Kim

Sang Kil Lee

Yu Sin Yang

Jae Wan Hong

Chung Sam Jun

An apparatus for exchanging a probe includes a stacker configured to receive a probe and to align the probe, a probe connector connected to the probe, and a laser alignment unit including a light emitter and a light receiver. The light emitter is configured to emit a laser beam to the probe, and the light receiver is configured to detect the laser beam reflected by the probe. The laser alignment unit is configured to detect when the probe is properly aligned on the probe connector using the light receiver, and the laser alignment unit is configured to stop moving the stacker when it is detected that the probe is properly aligned.

Growing community of inventors

Suwon-si, South Korea

Jeong Hoi Kim