Infineon Technologies Ag

Jens Rosenbusch

Ulrich Backhausen

Thomas Kern

Thomas Nirschl

Giacomo Curatolo

Thomas Steinecke

Edvin Paparisto

Thomas Ehben

Franz Renner

Michael Goessel

Thomas Liebermann

Muhammad Hassan

Heiko Ahrens

Daniel Tille

Sunanda Manjunath

Ning Chen

Xiangting Bi

Klaus Oberländer

Georg Duchrau

What is proposed is a solution for processing errors in a sequence of bits, wherein the sequence of bits, in the error-free case, forms a codeword of an error code, wherein the error code is based on an H-matrix or is able to be determined thereby, wherein an error syndrome is determined for the sequence of bits, wherein a link is determined between components of the error syndrome and parts of the H-matrix, and wherein two adjacent bits in the sequence of bits are corrected if the link adopts a predefined value.

Error processing and correction of adjacent 2-bit errors

Testing of at least one source by a destination is provided, which comprises: (i) the destination supplies a test signal towards the at least one source; (ii) at the at least one source, determining a second output signal based on a first output signal and the test signal via a first function; (iii) conveying the second output signal to the destination; (iv) at the destination, determining a received signal based on the second output signal received from the at least one source and based on the test signal via a second function; and (v) determining whether an error occurred based on the received signal. Also, an according system is provided.

Signal test

Systems, methods, circuits, and devices for data protection are provided. In one example, a data processing device incudes a Physical Unclonable Function (PUF) source that is configured to generate PUF values, a bus, a plurality of bus access components that are configured to access the bus, and a masking information generation circuit. The masking information generation circuit is configured to generate masking information for at least one pair of bus access components using at least one PUF value and to transmit said information to the bus access components. The pair is configured in such a way that one bus access component masks the data according to the masking information generated for the pair before the data is sent over the bus and the other bus access component de-masks the data received over the bus according to the masking information generated for the pair.

Data processing device and method for transmitting data over a bus

Systems, methods, and circuitries are provided for checking integrity of code received from an external memory. In one example, a system includes a non-volatile memory and a controller. The non-volatile memory includes a first partition configured to store first data corresponding to program code and a second partition configured to store second data corresponding to a copy of the first data. The controller that includes a processor and comparator circuitry. The comparator circuitry is configured to receive a portion of the first data and a corresponding portion of the second data, compare the portion of the first data to the portion of the second data, when the portion of the first data matches the portion of the second data, provide the portion of the first data to the processor, and when the portion of the first data does not match the portion of the second data, generate an alarm signal.

Execute in place architecture with integrity check

An integrated circuit with self-test circuit is provided. The integrated circuit includes at least one logic circuit, at least one input storage element for storing work data, at least one output storage element, an input test storage element for storing test data, and at least one output test storage element, wherein the logic circuit is selectively connected to the input storage element on the input side, such that the input storage element provides the work data to the logic circuit, or is connected to the input test storage element on the input side, such that the input test storage element provides the test data to the logic circuit, wherein the logic circuit is further connected to the output storage element and the output test storage element on the output side, such that the logic circuit feeds data to the output storage element and/or to the output test storage element, and wherein the output storage element is configured to process the data from the logic circuit if the work data are provided to the logic circuit, and not to process the data from the logic circuit if the test data are provided to the logic circuit.

Integrated circuit with self-test circuit, method for operating an integrated circuit with self-test circuit, multi-core processor device and method for operating a multi-core processor device

A memory system having a flexible read reference is disclosed. The system includes a memory partition, a failcount component, and a controller. The memory partition includes a plurality of memory cells. The failcount component is configured to generate failcounts in response to read operations of the memory partition. The controller is configured to calibrate a reference value for the memory partition by utilizing the failcounts.

Systems and methods utilizing a flexible read reference for a dynamic read window

A method for monitoring a resistive memory having an array of cells coupled between respective bitlines and respective wordlines. The method includes determining, by a current determining circuit, a cell current and a cell current change rate of at least one of the cells; determining, by a control circuit, whether the cell current change rate is outside of a cell current change rate predefined range; performing, by the control circuit, a predetermined action if the control circuit determination is positive; and storing, in a memory, the determined cell current at predetermined times, and to store the determined cell current change rate.

Resistive memory transition monitoring

A circuit for monitoring a resistive memory having an array of cells coupled between respective bitlines and respective wordlines. The circuit includes a current determining circuit configured to determine a cell current and a cell current change rate of at least one of the cells; and a control circuit configured to: determine whether the cell current change rate is outside of a cell current change rate predefined range; and perform a predetermined action if the control circuit determination is positive.

The disclosure relates to an electronic memory system, and more specifically, to a system to emulate an electrically erasable programmable read-only memory, and a method to emulate an electrically erasable programmable read-only memory. According to an embodiment of the disclosure, a system to emulate an electrically erasable programmable read-only memory is provided, the system including a first memory section and a second memory section, wherein the first memory section comprises a plurality of storage locations configured to store data partitioned into a plurality of data segments and wherein the second memory section is configured to store information mapping a physical address of a data segment stored in the first memory section to a logical address of the data segment.

System and method to emulate an electrically erasable programmable read-only memory

The invention relates to an electronic memory system, and more specifically, to a system for emulating an electrically erasable programmable read only memory in a non-volatile memory device, and a method of emulating an electrically erasable programmable read only memory in a non-volatile memory device. According to an embodiment, a system for emulating an electrically erasable programmable read only memory is provided, the system including a Flash memory, wherein the Flash memory is configurable into a first region and a second region, wherein the first region is adapted to store a first class of data and the second region is adapted to store a second, different class of data.

System and method for emulating an EEPROM in a non-volatile memory device

A system and method for performing three scans for testing an address decoder and word line drive circuits is disclosed. The first scan determines whether only one word line is selected. The second scan determines whether the word line rise time to a target voltage level is within a specified time. Finally, the third scan determines whether the correct word line was selected.

Word line address scan

An integrated circuit having capacitive elements for smoothing a supply voltage is described. In this case, at least one additional metal electrode, which is configured as a high frequency-optimized capacitance and is distinguished by an extremely low sheet resistance, is connected in parallel with the MOS capacitances. By connecting the areally highly effective MOS capacitance, which, however, is connected with a somewhat higher impedance, in parallel with areally less effective metal capacitances, which, however, are connected to the supply voltage in a very low-impedance manner, it is possible to obtain broadband buffering and thus decoupling of high-frequency interference signals. Very high-frequency interference components are attenuated on the chip and do not pass into the system surrounding the integrated circuit.

Integrated circuit having capacitive elements

A method is described for transmitting signals on a pair of lines, whereby the signals pass alternately from a low level to a high level. The signals on one line of the pair transmit a complementary level of signals to the other line of the pair, whereby signal drivers are used in a manner to affect an exchange in the levels of the transmitted signals. First, the signal drivers that send complementary levels of signals to the two lines are isolated from the lines. Second, the lines are short-circuited so that an identical intermediary potential between the low-level and the high-level signal, is applied. Third, the short-circuit is removed and the signal drivers are connected so that inversely complementary levels of signals can be sent to both lines.

Method and apparatus for the transmission of differential signals

A configuration and a method for matching output drivers of integrated circuits to specified conditions include parameters to be taken into account when matching output drivers and/or control signals based on the parameters for matching the output drivers, to be provided in digital form. The configuration and method may additionally or alternatively perform matching by taking into account a level or waveform of a supply voltage of an integrated circuit and/or a technology used in the integrated circuit and/or technical data on a load to be driven and/or demands placed on the output drivers by the load to be driven.

Growing community of inventors

Munich, Germany

Jens Rosenbusch