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Jengwei Pan

Larry L Biro

A method for performing integrated section-level and full-chip timing verification is employed for integrated circuit designs that include several section designs. A plurality of bristle timing parameters define timing relationships between the section designs. A section-level verification procedure is performed for each of the section designs to determine whether the section designs conform to predetermined intra-section timing constraints. A full-chip verification procedure is performed for the integrated circuit design to determine the bristle timing parameters and to determine whether the integrated circuit design conforms with predetermined intersection timing constraints.

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Westboro, MA, United States of America

Jengwei Pan