Taiwan Semiconductor Manufacturing Comp. Ltd.

Jen-Pan Wang

Chih-Fu Chang

Ru-Shang Hsiao

Chien-Hsuan Liu

Hsiu-Jung Yen

Ling-Sung Wang

Yu-Hong Pan

Chih-Mu Huang

Lin-June Wu

Ho-Yin Yiu

Jiun-Jie Huang

Chao-Chi Chen

Cing-Yao Chan

Chun-Ying Wang

Chein-Ling Jan

Chih-Hsun Lin

Chih-Kang Chao

Mei-Hsuan Lin

Ching-Hsien Chen

Chung-Yuan Yang

Chih-Chan Lu

I-Chih Chen

Ying-Tsung Chen

Wen-Cheng Chien

Fu-Tsun Tsai

Tsung-Han Wu

I-i Cheng

Tong-Min Weng

Huan-Kuan Su

Wei-Huan Fu

Wen-Han Hung

Yi-Wen Wang

Jia-Ming Huang

Yaling Huang

A semiconductor device includes a device layer, a first passivation layer, an aluminum pad, a second passivation layer, an under-ball metallurgy (UBM) pad and a connector. The device layer is disposed over a substrate, wherein the device layer includes a top metal feature. The first passivation layer is disposed over the device layer. The aluminum pad penetrates through the first passivation layer and is electrically connected to the top metal feature. The second passivation layer is disposed over the aluminum pad. The UBM pad penetrates through the second passivation layer and is electrically connected to the aluminum pad. The connector is disposed over the UBM pad. In some embodiments, a first included angle between a sidewall and a bottom of the aluminum pad is greater than a second included angle between a sidewall and a bottom of the UBM pad.

Semiconductor device and method of forming the same

A plurality of openings is formed in a dielectric layer formed on a semiconductor substrate. The plurality of openings comprises a first opening extending to the semiconductor substrate, a second opening extending to a first depth that is substantially less than a thickness of the dielectric layer, and a third opening extending to a second depth that is substantially greater than the first depth. A multi-layer gate electrode is formed in the first opening. A thin resistor structure is formed in the second opening, and a connection structure is formed in the third opening, by filling the second and third openings substantially simultaneously with a resistor metal.

Resistor structure

A metal-oxide-semiconductor field-effect transistor (MOSFET) includes a substrate, a source and a drain in the substrate, a gate electrode disposed over the substrate between the source and drain. An inner spacer is disposed at least partially over the gate electrode. An outer spacer is disposed adjacent to a sidewall of the gate electrode.

Metal-oxide-semiconductor field-effect transistor with spacer over gate

Semiconductor devices and methods of forming the same are disclosed. A semiconductor device includes a substrate, a gate structure over the substrate, a spacer and a source/drain region. The gate structure is disposed over the substrate. The spacer is disposed on a sidewall of the gate structure, wherein the spacer has a top surface lower than a top surface of the gate structure. The source/drain region is disposed adjacent to a sidewall of the spacer.

A method for forming a semiconductor device and the resulting device are provided. At least one capacitor in a first gate structure is formed over a substrate. The at least one capacitor includes a first gate electrode including a first conductive layer, a semiconductor layer including a semiconductor material and a dopant, a dielectric layer disposed between the first gate electrode and the semiconductor layer, and a second conductive layer contacting the semiconductor layer. The at least one resistor includes a third conductive layer and is electrically connected to the at least one capacitor.

Device including resistor-capacitor (RC) structure and method of making the same

The present disclosure relates a back-end-of-the-line (BEOL) metallization stack having an air gap disposed between adjacent metal interconnect features, which provides for an inter-level dielectric material with a low dielectric constant. In some embodiments, the BEOL metallization stack has an inter-level dielectric (ILD) layer disposed over a substrate. A metal interconnect layer is disposed within the ILD layer, and an air gap is arranged disposed within the ILD layer at a position between a first feature and a second feature of the metal interconnect layer. The air gap has an upper surface with a first curve that meets a second curve at a peak arranged below a top of the metal interconnect layer. The first curve becomes steeper as a distance from the peak decreases and the second curve becomes steeper as a distance from the peak decreases.

Air-gap scheme for BEOL process

The present disclosure relates to a transistor device having a channel region comprising a sandwich film stack with a plurality of different layers that improve device performance, and an associated apparatus. In some embodiments, the transistor device has a source region and a drain region disposed within a semiconductor substrate. A sandwich film stack is laterally positioned between the source region and the drain region. The sandwich film stack has a lower layer, a middle layer of a carbon doped semiconductor material disposed over the lower layer, and an upper layer disposed over the middle layer. A gate structure is disposed over the sandwich film stack. The gate structure is configured to control a flow of charge carriers in a channel region located between the source region and the drain region.

Sandwich EPI channel for device enhancement

A passive device and method of fabricating the passive device are disclosed herein. The capacitor structure incorporates a resistor and a capacitor. An exemplary method includes receiving a substrate that has undergone front end of line (FEOL) processing, and performing back end of line (BEOL) processing on the substrate, wherein a capacitor structure is formed over the substrate during the BEOL processing, the capacitor structure incorporating a resistor with a capacitor. The BEOL processing can include performing a first metallization process to form a bottom plate of the capacitor structure; forming a dielectric spacer of the capacitor structure over the bottom plate; forming a top plate of the capacitor structure over the dielectric spacer; and performing a second metallization process to form contacts coupled to the top plate and the bottom plate of the capacitor structure.

Resistor and metal-insulator-metal capacitor structure and method

Structure of resistor

Various non-planar reflective lithography masks, systems using such lithography masks, and methods are disclosed. An embodiment is a lithography mask comprising a transparent substrate, a reflective material, and a reticle pattern. The transparent substrate comprises a curved surface. The reflective material adjoins the curved surface of the transparent substrate, and an interface between the reflective material and the transparent substrate is a reflective surface. The reticle pattern is on a second surface of the transparent substrate. A reflectivity of the reticle pattern is less than a reflectivity of the reflective material. Methods for forming similar lithography masks and for using similar lithography masks are disclosed.

Reflective lithography masks and systems and methods

A method comprises removing a dummy gate electrode layer to form a gate trench in a dielectric layer over a substrate, forming a resistor trench over the substrate, depositing a plurality of films on a bottom of the gate trench, a bottom of the resistor trench, sidewalls of the gate trench and sidewalls of the resistor trench, depositing a gate electrode layer over the plurality of films and removing an upper portion of the gate electrode layer until the gate electrode layer is removed from the resistor trench.

Metal gate structure and method

The present disclosure relates to a method of forming a transistor device having a channel region comprising a sandwich film stack with a plurality of different layers that improve device performance, and an associated apparatus. In some embodiments, the method is performed by selectively etching a semiconductor substrate to form a recess along a top surface of the semiconductor substrate. A sandwich film stack having a plurality of nested layers is formed within the recess. At least two of the nested layers include different materials that improve different aspects of the performance of the transistor device. A gate structure is formed over the sandwich film stack. The gate structure controls the flow of charge carriers in a channel region having the sandwich film stack, which is laterally positioned between a source region and a drain region disposed within the semiconductor substrate.

Sandwich epi channel for device enhancement

The present disclosure relates a method of forming a back-end-of-the-line (BEOL) metallization layer having an air gap disposed between adjacent metal interconnect features, which provides for an inter-level dielectric material with a low dielectric constant, and an associated apparatus. In some embodiments, the method is performed by forming a metal interconnect layer within a sacrificial dielectric layer overlying a substrate. The sacrificial dielectric layer is removed to form a recess extending between first and second features of the metal interconnect layer. A protective liner is formed onto the sidewalls and bottom surface of the recess, and then a re-distributed ILD layer is deposited within the recess in a manner that forms an air gap at a position between the first and second features of the metal interconnect layer. The air gap reduces the dielectric constant between the first and second features of the metal interconnect layer.

A passive circuit device incorporating a resistor and a capacitor and a method of forming the circuit device are disclosed. In an exemplary embodiment, the circuit device comprises a substrate and a passive device disposed on the substrate. The passive device includes a bottom plate disposed over the substrate, a top plate disposed over the bottom plate, a spacing dielectric disposed between the bottom plate and the top plate, a first contact and a second contact electrically coupled to the top plate, and a third contact electrically coupled to the bottom plate. The passive device is configured to provide a target capacitance and a first target resistance. The passive device may also include a second top plate disposed over the bottom plate and configured to provide a second target resistance, such that the second target resistance is different from the first target resistance.

A method includes forming a dummy gate stack over a semiconductor substrate, removing the dummy gate stack to form a recess, and implanting a portion of the semiconductor substrate through the recess. During the implantation, an amorphous region is formed from the portion of the semiconductor substrate. The method further includes forming a strained capping layer, wherein the strained capping layer extends into the recess. An annealing is performed on the amorphous region to re-crystallize the amorphous region. The strained capping layer is then removed.

Growing community of inventors

Tainan, Taiwan

Jen-Pan Wang