Colorado State University Research Foundation

Jen-Mei Chang

Michael Joseph Kirby

Bruce Anthony Draper

Holger Philipp Kley

Christopher Scott Peterson

James Ross Beveridge

A pattern recognition system compares a set of unlabeled images (or other patterns) having a variation of state in a set-by-set comparison with individual data sets of multiple labeled images (or other patterns) also having a variation of state. The individual data sets are each mapped to a point on a parameter space (e.g., a Grassmannian manifold, a Stiefel manifold, a flag manifold, etc.), and the set of unlabeled images is mapped to a point in the same parameter space. If the point associated with the set of unlabeled images satisfies a distance criterion on the parameter space with regard to one of the points on the parameter space, the data set of unlabeled images is assigned to the class attributed to that point.

Growing community of inventors

Fort Collins, CO, United States of America

Jen-Mei Chang