Nxp Usa, Inc.

Freescale Semiconductor,inc.

Nxp B.v.

Other

Jehoda Refaeli

Nancy Hing-Che Amedeo

James B Eifert

Ankush Sethi

Jeffrey William Scott

Amit Gupta

Stefano Pietri

Gary L Miller

Alfredo Olmos

Chris C Dao

Ray Charles Marshall

James Andrew Welker

Florian Bogenberger

Quyen Pho

Shreya Singh

Thomas W Liston

Glenn Charles Abeln

Wenzhong Zhang

Hemant Nautiyal

Ashish Sharma

Jeffrey Freeman

Jefferson Daniel De Barros Soldera

Rohit Kumar Kaul

Yi Zhao

Larry Alan Woodrum

Jonathan J Gamoneda

Jorge Arturo Corso Sarmiento

Vaibhav Kumar

Arjun Pal Chowdhury

An aspect of the invention is directed towards a data processing system and method including a transaction scheduler configured to process transactions, a tag control circuit coupled to the transaction scheduler configured to detect a fault by comparing output signals, and a controller coupled to the tag control circuit. The controller is configured to receive a transaction request identifying a transaction, generate a unique tag value for the transaction request, load the unique tag value into the transaction scheduler, determine a current unique tag value associated with the transaction being executed, and generate a fault. The system is further configured to generate fault when: (i) the current unique tag value is not found, or (ii) the transactions timeout after a predetermined number of cycles.

Data processing system with tag-based queue management

A data processing system includes a memory configured to receive memory access requests. Each memory access request having a corresponding access address and having a corresponding parity bit for an address value of the corresponding access address. The corresponding access address is received over a plurality of address lines and the parity bit is received over a parity line. The memory includes a memory array having a plurality of memory cells arranged in rows, each row having a corresponding word line of a plurality of word lines, and a row decoder coupled to the plurality of address lines, the parity line, and the plurality of word lines. The row decoder is configured to selectively activate a selected word line of the plurality of word lines based on the corresponding access address and the corresponding parity bit of a received memory access request. The concept can also be used with parity bits on columns of the memory cells and a column decoder that selects bit lines associated with column address lines.

Devices and methods for preventing errors and detecting faults within a memory device

A data processing system includes a system interconnect, a first master, and a bridge circuit. The bridge circuit is coupled between the first master and the system interconnect. The bridge circuit is configured to, in response to occurrence of an error in the first master, isolate the first master from the system interconnect, wherein the isolating by the bridge circuit is performed while the first master has one or more outstanding issued write commands to the system interconnect which have not been completed. The bridge circuit is further configured to, after isolating the first master from the system interconnect, complete the one or more outstanding issued write commands while the first master remains isolated from the system interconnect.

Safe-stating a system interconnect within a data processing system

A fault collection and reaction system on a system-on-chip (SoC) includes a plurality of reaction cores assigned to a plurality of applications being executed by a plurality of processor cores on the SoC, at least one look-up table (LUT), and a controller. The at least one LUT stores therein a first mapping between the plurality of reaction cores and corresponding plurality of domain identifiers, and a second mapping between a plurality of faults and a set of reaction combinations. The controller receives a fault indication and a first domain identifier in response to occurrence of a first fault and selects from the plurality of reaction cores, a first reaction core mapped to the first domain identifier, and from the set of reaction combinations, a first reaction combination mapped to the first fault. The first reaction core responds to the fault indication with a reaction based on the selected reaction combination.

Method and system for fault collection and reaction in system-on-chip

Error detection circuitry is configured to receive raw read data from a memory, perform error detection in accordance with a single-bit error correction and double-bit error detection (SECDEC) error-correction code (ECC) on the raw read data, and provide a single bit correction indicator in response to performing the SECDEC ECC on the raw read data. Error correction circuitry is configured to provide corrected read data corresponding to the raw read data based at least on the single bit correction indicator. ECC checking circuitry is configured to generate a wrong operation indicator based at least on a parity of the raw read data, a parity of the corrected read data, and the single bit correction indicator, wherein the ECC checking circuitry is configured to assert the wrong operation indicator when at least one of the error detection circuitry or the error correction circuitry is not operating correctly.

Circuitry for checking operation of error correction code (ECC) circuitry

A data processing system configured to execute a plurality of threads includes a plurality of domains and a plurality of domain interrupt controller circuits, each domain interrupt controller corresponding to a domain of the plurality of domains. Each domain interrupt controller includes an interrupt selection circuit configured to select an interrupt request from a set of interrupt requests received by the interrupt selection circuit and determine an interrupt vector for the selected interrupt request, a programmable domain-thread storage circuit configured to store an enable indicator corresponding to each thread of the plurality of threads in which the enable indicator for each corresponding thread indicates whether or not the corresponding domain is permitted to route interrupt vectors to the corresponding thread, and a routing circuit configured to route the interrupt vector to a selected thread of the plurality of threads which is selected based at least in part on the enable indicators.

Systems and methods for interrupt distribution

A data processing system and methods for operating the same are disclosed. The method includes detecting a fault by comparing output signals from a first processing core and a second processing core, entering a safe mode based upon detecting the fault, completing transactions while in the safe mode, and determining whether the fault corresponds to a hard error. Based upon the fault corresponding to a hard error, one of processing cores is identified as a faulty core. The faulty core is inhibited from executing instructions and the other processing core is allowed to execute instructions.

Data processing system having lockstep operation

A method for managing thread execution in a processing system is provided. The method includes setting a first watchpoint, and generating a first watchpoint trigger corresponding to the first watchpoint. In response to the first watchpoint trigger, execution of a first thread is controlled in accordance with a value stored in a first control register. Controlling the first thread may further include disabling execution of the first thread. The disabling execution of the first thread may occur within the first watchpoint region.

Data processing system having dynamic thread control

A comparator used in a clock signal generation circuit compares two input signals and generates an output signal. The comparator has first and second input transistors coupled to the input signals. First and second hysteresis transistors are coupled between the input transistors and an output stage of the comparator, and apply hysteresis to a comparison of the input signals. First and second hysteresis control transistors are coupled between the input transistors and the hysteresis transistors to isolate the hysteresis transistors from the input transistors under control of a hysteresis enable signal. The comparator is operable in a first mode or a second mode based on a hysteresis enable signal. In the first mode the comparator applies hysteresis to the comparison of the input signals and in the second mode, compares the input signals without hysteresis.

Comparator and clock signal generation circuit

A system for detecting soft errors in a memory device includes a latch, a master flip-flop and a slave flip-flop. The latch receives input data (control and/or address signals) at the beginning of a memory operation in response to a rising edge of a first clock signal. The output of the latch is provided to the master flip-flop. The master flip-flop continuously receives and stores the latch output during the memory operation based on a second clock signal. The slave flip-flop receives and stores the output of the master flip-flop at the end of the memory operation based on the second clock signal. A comparator compares the input data with the output of the slave flip-flop to detect soft errors that occur during the memory operation.

System and method for soft error detection in memory devices

An interface including first and second transport protocol circuitry, a memory and a mode controller. The interface includes first and second physical interface types which are both selectively enabled to interface a set of pads. The first transport protocol circuitry is operative with the first type physical interface in a first mode and the second transport protocol circuitry is operative with the second type physical interface in a second mode. The memory stores a mode value indicative of the operating mode. The mode controller enables one of the physical interface types and a corresponding transport protocol based on the mode value. The first mode is the default mode, and the mode controller enables dynamic transition to the second mode. An escape indication may be enabled during the second mode for dynamic transition back to the first mode. Programmable timing values may be used to facilitate mode transitions.

Interface system and method with backward compatibility

A method includes receiving a set of voltages comprising at least a first voltage, a second voltage, and a third voltage and biasing a well of a transistor based on the extreme voltage of the set of voltages. Biasing the well of the transistor can include concurrently providing a first signal and a second signal based on a comparison of the first voltage and the second voltage and selectively coupling the well of the transistor to a source of the extreme voltage of the set of voltages based on the first signal, the second signal, and the third voltage. An electronic device comprises a transistor and a power switching module. The power switching module includes a set of inputs, each input configured to receive a corresponding one of a set of voltages comprising at least a first voltage, a second voltage, and a third voltage, and includes an output coupled to a well of the transistor, the output configured to provide the extreme voltage of the set of voltages.

Device and technique for transistor well biasing

A data processing system includes a processor having a multi-way cache which has a first and a second way. The second way is configurable to either be redundant to the first way or to operate as an associative way independent of the first way. The system may further include a memory, where the processor, in response to a read address missing in the cache, provides the read address to the memory. The second way may be dynamically configured to be redundant to the first way during operation of the processor in response to an error detection signal. In one aspect, when the second way is configured to be redundant, in response to the read address hitting in the cache, data addressed by an index portion of the read address is provided from both the first and second way and compared to each other to determine if a comparison error exists.

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Austin, TX, United States of America

Jehoda Refaeli