Synopsys, Inc.

G-analog Design Automation Limited

Jeh-Fu Tuan

Han Young Koh

Tak K Young

Peiqi He

Chiping Ju

Hurley H Song

A method for migrating a hierarchical layout between manufacturing processes is accomplished without specification of a technology file and design rules. Different scaling factors and bias values in the X and Y directions may be applied to each layer in the source hierarchical layout during the migration. In addition, the target hierarchical layout maintains connectivity, and is free of notches, jogs and small edges. A cell hierarchy tree is created, which guides expansion of the target hierarchical database to resolve issues related to rounding of floating point numbers to integers. Boolean operations are performed to determine the differences between target flat database and the target hierarchical database. The differences are eliminated by modifying the target hierarchical database to match the layout in the flat database.

Layout migration with hierarchical scale and bias method

A method for power net analysis of integrated circuits is provided. A circuit simulator determines current values for integrated circuit devices at specified supply voltages. A power net simulator uses the current values to calculate characteristics of the power net. The characteristics include voltage drop, current density and ground bounce. A layout representation of the power net is shown on a computer display along with the user-specified characteristics.

Integrated circuit power net analysis

A unique, efficient method and system for reliability simulation of a semiconductor chip design comprising millions of transistors. Specifically, the instant method starts by storing device information about a chip design as inputted. Next, by first partitioning the complex circuit of the design into numerous smaller stages, each of which confines direct current flow within its boundary, then estimating the current consumption and the relative current contribution of each transistor for each stage, the method of the present invention determines the individual currents of all power network transistors with sufficient accuracy for reliability simulation. The instant method then uses the individual transistor currents and the stored device information, including data of an accurate resistor-capacitor model of the power network, to determine the branch currents and node voltages in all interconnect wires of the power network. Finally, the instant method reports all potential problems of the design identified based on the values of the branch currents and node voltages. As such, the present invention enables circuit designers to pinpoint where voltage drop and electro-migration may pose problems and take appropriate corrective actions before chips are fabricated and sold. Thus, the present invention provides a novel and superior method for reliability simulation over the prior art by offering much greater simulation speed and capacity over conventional reliability simulation tools while delivering highly accurate results for reliability analysis crucial to today's deep sub-micron CMOS designs.

Method and system for reliability analysis of CMOS VLSI circuits based on stage partitioning and node activities

A method for testing for power supply network voltage drop violations in an integrated circuit through a computer simulation. First, the IC chip area is divided into a number of discrete regions. The simulation time is divided into a number of time segments. Next, the average aggregate currents corresponding to the transistors for each of the regions are calculated for each of the time segments. Only when a peak average current occurs for any one of the plurality of regions is the power supply network of the IC chip simulated for that time segment. Based on the voltage drops as determined by the power network simulation, violation conditions can be easily identified. Thus, the power network of the IC chip is simulated only when there is found to be high switching activity in some region of the chip. This is more efficient than performing power network voltage drop analyses all the time, even when switching activity throughout the chip is low and the likelihood of any voltage drop violations is very low.

Method and system of performing voltage drop analysis for power supply

The present invention pertains to a method for analyzing a semiconductor chip design for determining potential voltage drop and electromigration problems. Initially, the semiconductor chip design is divided into a plurality of blocks. A block level verification is then performed based on the assumption that full voltage is being supplied to each of the blocks. Next, the blocks are modeled by an equivalent RC network. This RC network is then reduced into a simpler representation. The voltage drops are determined based on the reduced, equivalent model. The blocks are then reanalyzed with the supply voltage input to the blocks reduced according to the calculated voltage drops. Thereby, a more realistic simulation can be achieved.

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San Jose, CA, United States of America

Jeh-Fu Tuan