Eads North America, Inc.

Western Digital Technologies, Inc.

Jeffrey Y Chen

Gary Carlson

Frank Landon

Scott A Rader

Joseph Talbert

Mark M Minot

An electronic device including a peripheral device connection unit configured to connect to a peripheral device and to receive identification data for the peripheral device, and a controller. The controller is configured to determine configuration information, wherein the configuration information is based at least on one of the identification data for the peripheral device or geographic location data for the electronic device, obtain a user interface selected from a plurality of user interfaces based at least partly on the configuration information, and automatically configure the electronic device based on the obtained user interface.

Method and apparatus for configuring an electronic device

A thermal interface device () includes a base member () and a pocket () which is filled with a thermally conductive material or medium such as diamond dust suspended in a solvent such as propylene glycol or a thermally conductive material such as thermally conductive rubber. The pocket () is hermitically sealed to the base member () in order to keep the thermally conductive material within the pocket. The filled pocket () forms a deformable 'pillow' having a high thermal conductance. The deformable pocket () can contour to the shape of a device it is pressed against such as an electronic device undergoing testing.

Thermal interface device

An electronic device burn-in thermal management system includes Burn-in-Boards (BIBs) with quick disconnect connectors to easily connect and disconnect the BIB () from liquid cooling lines () in a rack that can hold one or more BIBs. The BIB () may include liquid cooled heat sinks () embedded in the BIB sockets () in order to cool the electronic devices undergoing burn-in test (DUT). This arrangement allows the DUT to make positive thermal contact with the heat sink when it is mounted in the BIB socket and allows the user to remove the BIB () quickly after completing a test to load the next batch of DUTs onto a separate BIB.

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Irvine, CA, United States of America

Jeffrey Y Chen