International Business Machines Corporation

Jeffrey W Kellington

John Andrew Schumann

Guy L Guthrie

Hugh Shen

Kevin Franklin Reick

Debapriya Chatterjee

Paul Frank Lecocq

Karen E Yokum

Bryant Cockcroft

Tharunachalam Pindicura

Paul Umbarger

Kevin Barnett

Lance G Hehenberger

Jamory Hawkins

Naoko Pia Sanda

Lawrence Leitner

Omesh Bajaj

Michael Stephen Floyd

Ronald Nick Kalla

Prabhakar Nandavar Kudva

Todd Alan Venton

Norman Karl James

Larry Scott Leitner

A method of checking for a stall condition in a processor is disclosed, the method including inserting an inline instruction sequence into a thread, the inline instruction sequence configured to read the result from a timing register during processing of a first instruction and store the result in a first general purpose register, wherein the timing register functions as a timer for the processor; and read the results from the timing register during processing of a second instruction and store the results in a second general purpose register, wherein the second instruction is the next consecutive instruction after the first instruction. The inline thread sequence may be inserted in sequence with the thread and further configured to compare the difference between the result in the first and second general purpose register to a programmable threshold.

Method and system for detection of thread stall

Techniques are provided for determining consequences of an injected fault on a system running a given application program or operating system, in order to measure the software impact of a hardware soft error on the application program/operating system. The application program software is emulated instruction-by-instruction, where source operands are randomly modified before an instruction is executed, and destination operands are randomly modified after an instruction is executed, in order to mimic hardware soft errors. In addition, a program counter is randomly modified after execution of a branch instruction. The resulting consequences of such modifications are monitored such that a fault of an instruction being executed is modeled in order to determine a soft error rate (SER) for a software application program or operating system.

Testing soft error rate of an application program

A test system tests a full system integrated circuit (IC) model that includes a device under test (DUT) IC model and a support IC model. A test manager information handling system (IHS) maps the full system IC model on a hardware accelerator simulator via an interface bus. The hardware accelerator simulator thus emulates the full system IC model. Of all possible fault injection points in the model, the test manager IHS selects a subset of those injection points for fault injection via a statistical sampling method in one embodiment. In response to commands from the test manager IHS, the simulator serially injects faults into the selected fault injection points. The test manager IHS stores results for respective fault injections at the selected injection points. If a machine checkstop or silent data corruption error occurs as a result of an injected fault, the DUT IC model may return to a stored checkpoint and resume operation from the stored checkpoint. The result information is useful in determining a soft error rate (SER) for the DUT IC.

Method and apparatus for testing a full system integrated circuit design by statistical fault injection using hardware-based simulation

Exemplary embodiments provide a computer-implemented method and a system for a startup cycle for a cycle deterministic start. An initializing mechanism applies power to a microprocessor. The initializing mechanism initializes the configuration of the microprocessor. The initializing mechanism initializes a timer. The initializing mechanism then sends a clock start command to the microprocessor. The clocks on the microprocessor are started. Upon the clocks starting, the timer begins and allows temporary transients, such as voltage droop due to a large instantaneous change in demand for current due to the commencement of clock switching. Responsive to the timer reaching a target value, an interrupt unit sends a system reset interrupt. Responsive to the interrupt unit sending the system reset interrupt, an instruction fetch unit fetches a first instruction. This operation will be deterministic to the state of the rest of the microprocessor memory elements (latches, arrays, et al.).

Method and apparatus to avoid power transients during a microprocessor test

An efficient system for bootstrap loading scans cache lines into a cache store queue during a scan phase, and then transmits the cache lines from the cache store queue to a cache memory array during a functional phase. Scan circuitry stores a given cache line in a set of latches associated with one of a plurality of cache entries in the cache store queue, and passes the cache line from the latch set to the associated cache entry. The cache lines may be scanned from test software that is external to the computer system. Read/claim dispatch logic dispatches store instructions for the cache entries to read/claim machines which write the cache lines to the cache memory array without obtaining write permission, after the read/claim machines evaluate a mode bit which indicates that cache entries in the cache store queue are scanned cache lines. In the illustrative embodiment the cache memory is an L2 cache.

Efficient system bootstrap loading

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Austin, TX, United States of America

Jeffrey W Kellington