Agilent Technologies, Inc.

Hewlett-packard Company

Jeffrey T Kernan

Patrick D Perkins

Charles William Russ, Iv

Mingda Wang

Carolyn C Broadbent

Edward C Cirimele

Jean L Truche

James L Bertsch

J Gerson Goldberg

Harry F Prest

Donald A Johnson

Charles Russ

An ion source is configured for electron ionization and produces coaxial electron and ion beams. The ion source includes an ionization chamber along an axis, a magnet assembly configured for generating an axial magnetic field in the ionization chamber, an electron source, and a lens assembly configured for directing the ion beam out from the ionization chamber along the axis, reflecting the electron beam back toward the electron source, and transmitting higher energy ions out from the ion source while reflecting lower energy ions toward a lens element for neutralization.

Axial magnetic ion source and related ionization methods

A device for manipulating ions which includes a perforated folder of electrically conductive material, a first electrode fixed to the holder and a second electrode extending parallel to the first electrode and spaced from the first electrode and holder. The second electrode is connected to the holder through a rigid support of electrically insulated material.

Apparatus for manipulation of ions and methods of making apparatus

A device for manipulating ions which includes a perforated folder of electrically conducted material, a first electrode fixed to the holder and a second electrode extending parallel to the first electrode and spaced from the first electrode and holder. The second electrode is connected to the holder through a rigid support of electrically insulated material.

An apparatus and method for removing neutral noise from a quadrupole mass filter ion beam. A mask plate has a lobed aperture centered on a longitudinal axis and positioned between a quadrupole mass filter exit end and an ion detector. The mask plate operates to remove neutral atoms from the ion beam that may interfere with instrument sensitivities. The lobed aperture passes the ion beam with little loss of the ion beam intensity. The invention substantially maintains signal intensity and removes unwanted noise from a mass spectrometer.

Mask plate with lobed aperture

The present invention relates to a mass spectrometer that includes an ionization source having a chamber for ionizing a fluid sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber may be formed from an inorganic conductive nitride or disulfide material or may be applied to a substrate as a coating. The invention also includes a method for reducing the interaction of a reactive analyte with the inner wall of the chamber by application or coating the inner wall of the chamber with an inert conductive material.

Ionization chamber for reactive samples

A quadrupole electrode assembly for a mass spectrometer and a method for forming the electrode assembly are provided. The quadrupole electrode assembly is comprised of an elongate outer tube, having an internal surface and an external surface wherein the outer tube is the outermost structure of the electrode assembly and supports a vacuum, and an electrode structure fused to the internal surface of the outer tube. Typically, there are four electrodes where each electrode includes an arced region having a conductive surface. The arced regions of the electrodes are aligned in parallel opposing pairs equidistant from a central axis. The four electrode structures can be four cylindrical glass tubes where the curvature of the arced region approximates a hyperbola. At least a portion of the surface of the arced region is a conductive region typically formed by applying a metal coating to the surface of the glass tube. The arced region of the electrode may be a hyperbola formed by placing the electrode structure in proximity to a first hyperbolic surface and modifying the shape of the electrode structure by heating the structure to its softening point. In response to a pressure differential, the structure expands to conform to the first hyperbolic surface.

Universal quadrupole and method of manufacture

The present invention provides a method and apparatus for formation of a quadrupole electrode assembly for a mass spectrometer. The quadrupole electrode assembly is comprised of an outer elongate tube having an internal and external surface where the outer elongate tube as the outermost structure may be used for supporting a vacuum and an electrode structure fused to the internal surface of the outer elongate tube. Typically there are four electrodes where each electrode includes an arced region having a conductive surface where the arcs are aligned in parallel opposing pairs equidistant from a central axis. In the preferred embodiment, the four electrode structures are four cylindrical glass tubes where the curvature of the arc approximates a hyperbola. At least a portion of the surface of the arc is a conductive region typically formed by applying a metal coating to the surface of the glass tube. The arced region of the electrode may be a hyperbola formed by placing the electrode structure in proximity to a first hyperbolic surface and modifying the shape of the electrode structure by heating the structure to its softening point. In response to a pressure differential, the structure expands to conform to the first hyperbolic structure.

Multipole technology is used generally for charged particle optics which includes separating, focusing, or collimating 'charged particles' (i.e., ions, electrons, etc.). A primary application of multipole technology is mass filters and particularly quadrupole mass filters. A quadrupole mass filter has a quadrupole substrate having four poles, each having a generally hyperbolic cross section, and interconnected by bridges. The bridges have apertures that facilitate the construction of poles inside the quadrupole substrate and prevent the build-up of unwanted charge. A plating substrate for electroplating is bonded to each pole substrate with a thin-film adhesion layer. Poles are electroplated upon these plating substrates. A diffusion barrier layer prevents the portions of the plating substrates from migrating to the quadrupole substrate where they would undermine the thin-film adhesion layer. Additionally, the diffusion barrier layer prevents portions of the thin-film adhesion layer from migrating away from the quadrupole substrate that could result in adhesion problems and contamination of the poles. Quadrupole mass filters formed with metallization and electroplating techniques have the advantages of consistent and predictable performance, high durability, nearly uniform thickness, and nearly hyperbolic cross-section that results in electric fields with a nearly idealized hyperbolic cross section.

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Santa Cruz, CA, United States of America

Jeffrey T Kernan