Seagate Technology Incorporated

Jeffrey Soon Beng Sim

Kay Hee Tang

UttHeng Kan

Edmun ChianSong Seng

YongPeng Chng

WeiLoon Ng

AikChuan Lim

Aik Chuan Lim

Steven TianChye Cheok

In one embodiment of the present invention, systems and methods are provided through which the capacity of a defect buffer in a microcontroller of a mass storage device is determined without regard for the quantity of defects on a recording medium. The capacity of the defect buffer is determined in varying examples, based on the amount of available buffer space and/or the application of the storage device. In one embodiment, the capacity of the defect buffer is less than the quantity of defects on the recording medium, wherein entries in a defect table on the recording medium are swapped in and out of the defect buffer as needed, such as using a most-recently-used scheme. In another embodiment of the present invention, systems and methods are provided through which the defect table is partitioned into a plurality of segments that are physically distributed throughout the recording medium.

System and method for adaptive storage and caching of a defect table

Systems and methods are provided through which a time domain equalized signal-to-noise-ratio (ESNR) of an electronic device is determined by executing ESNR determining firmware in the electronic device. The ESNR is used to perform rejection/acceptance testing of the electronic device during manufacturing of the device, and/or to perform read channel tuning and optimization. In one embodiment, determination of the ESNR includes both phase level retry and global level retry.

System and method to determine the time domain equalized signal-to-noise ratio of a mass storage device

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Singapore, Singapore

Jeffrey Soon Beng Sim