Growing community of inventors

Lincoln, NE, United States of America

Jeffrey S Hale

Average Co-Inventor Count = 4.19

ph-index = 8

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 162

Jeffrey S HaleMartin M Liphardt (22 patents)Jeffrey S HalePing He (21 patents)Jeffrey S HaleBlaine D Johs (19 patents)Jeffrey S HaleCraig M Herzinger (18 patents)Jeffrey S HaleGalen L Pfeiffer (12 patents)Jeffrey S HaleJohn A Woollam (10 patents)Jeffrey S HaleSteven E Green (9 patents)Jeffrey S HaleBrian D Guenther (4 patents)Jeffrey S HaleJeremy A Van Derslice (3 patents)Jeffrey S HaleStefan Schoeche (3 patents)Jeffrey S HaleThomas E Tiwald (2 patents)Jeffrey S HaleChristopher A Goeden (2 patents)Jeffrey S HaleRonald A Synowicki (2 patents)Jeffrey S HaleDuane E Meyer (2 patents)Jeffrey S HaleBrooks A Hitt (2 patents)Jeffrey S HaleJames D Welch (1 patent)Jeffrey S HaleChristopher D Hassler (1 patent)Jeffrey S HaleJeffrey S Hale (34 patents)Martin M LiphardtMartin M Liphardt (122 patents)Ping HePing He (78 patents)Blaine D JohsBlaine D Johs (102 patents)Craig M HerzingerCraig M Herzinger (88 patents)Galen L PfeifferGalen L Pfeiffer (42 patents)John A WoollamJohn A Woollam (61 patents)Steven E GreenSteven E Green (38 patents)Brian D GuentherBrian D Guenther (8 patents)Jeremy A Van DersliceJeremy A Van Derslice (9 patents)Stefan SchoecheStefan Schoeche (9 patents)Thomas E TiwaldThomas E Tiwald (21 patents)Christopher A GoedenChristopher A Goeden (16 patents)Ronald A SynowickiRonald A Synowicki (13 patents)Duane E MeyerDuane E Meyer (10 patents)Brooks A HittBrooks A Hitt (3 patents)James D WelchJames D Welch (53 patents)Christopher D HasslerChristopher D Hassler (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. J.a. Woollam Co. (34 from 211 patents)


34 patents:

1. 11675208 - Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a super continuum laser source of a beam of electromagnetism, and improved detector system

2. 10989601 - Beam focusing and reflective optics

3. 10775298 - Ellipsometer or polarimeter system having at least one rotating element which is driven by a motor comprising air bearing

4. 10338362 - Beam focusing and reflecting optics with enhanced detector system

5. 10175160 - Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory

6. 10061068 - Deviation angle self-compensating substantially achromatic retarder

7. 10018815 - Beam focusing and reflective optics

8. 9976902 - Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory

9. 9952141 - Method of characterizing a beam of electromagnetic radiation in ellipsometer and the like systems

10. 9921395 - Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area

11. 9500843 - Beam focusing and beam collecting optics

12. 9442016 - Reflective focusing optics

13. 9347768 - In line ellipsometer system and method of use

14. 8436994 - Fast sample height, AOI and POI alignment in mapping ellipsometer or the like

15. 8159672 - Sample investigating system and method of use

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