Honeywell G.m.b.h.

Honeywell International Inc.

Jeffrey P Graebel

James B Hobbs

Yifei Zhang

John D Coddington

A method and system for reducing transient event effects, such as radiation effects, in an electrostatic discharge (ESD) power clamp is provided. The ESD power clamp includes triggering circuitry to determine the on-time of the power clamp during an ESD event, and drive circuits driving pull down devices to carry the ESD current. Two separate driver circuits are used to control the pull down circuits separately to guard against a single event effect (SEE). The ESD power clamp operates when both drive circuits are operated simultaneously to shunt the ESD to ground.

Method and system for reducing transient event effects within an electrostatic discharge power clamp

The improvement of the present invention provides configurable selection circuitry, which may be used to substitute auxiliary memory locations into a matrix memory. The configurable selection circuitry, after configuration, operates in response to selected signals to drive an auxiliary memory location while disabling the memory location formerly driven by the selected signals.

Configurable memory address decoder for integrated memory circuits with

A voltage reference generator based on a pair of differentially connected transistor devices, having a current sink at that connection, with one leg of the differential pair adapted for connection to a first voltage and the other leg having a pair of series-connected impedances connected thereto and adapted at the opposite end for connection to a second voltage supply.

Reference voltage generator

An integrated Schottky logic (ISL) read only memory (ROM) uses ISL drivers and decoders connected to wordlines and data bitlines. The pattern of data stored in the ISL is determined by Schottky diodes which are connected between selected data bitlines and wordlines. Improved performance is achieved by using a leakage current compensation source (such as a wordline pullup resistor) connected to each wordline, and by using a programmable dummy load (such as one or more dummy bitlines). The pullup resistors compensate for bitline loading sensitivity caused by leakage currents of the workline drivers. The dummy bitlines are selectively connected to those wordlines which are lightly loaded to compensate for wordline loading sensitivity and thus equalize access time and improve wordline decoder noise margins.

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Maple Grove, MN, United States of America

Jeffrey P Graebel