Knowles Electronics, Inc.

Littlefuse, Inc.

Jeffrey Niew

Anthony D Minervini

Peter V Loeppert

Stephen J Whitney

Edwin James Harris

Michael J Weber

Lawrence A Grunert

David Giesecke

A package is provided. The package has a substrate and a cover. A MEMS die is provided having a diaphragm. A CMOS die is provided wherein at least a portion of the CMOS die is positioned between the diaphragm and the substrate.

Package with a CMOS die positioned underneath a MEMS die

A number of integrated circuit dies having on board protection against electrical overstress (EOS) transients are provided. Generally, the devices have an integrated circuit die with an outer periphery and a functional die area. A plurality of conductive input/output pads are formed on the integrated circuit die. Typically, a first conductive guard rail is disposed on the integrated circuit die and forms a gap between each one of the input/output pads. A voltage variable material is disposed in the gaps between the conductive guard rail and the input/output pads. Typically, a plurality of electrical leads are electrically connected to a respective one of the plurality of conductive input/output pads. At normal operating voltages, the voltage variable material is non-conductive. However, in response to an EOS transient, the voltage variable material switches to a low resistance state, providing a conductive path between the conductive guard rail and the input/output pads.

Protection of an integrated circuit with voltage variable materials

Growing community of inventors

Burr Ridge, IL, United States of America

Jeffrey Niew