Fluke Corporation

Jeffrey M Kresch

Steffen Ludwig

Reno Gärtner

Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.

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Minocqua, WI, United States of America

Jeffrey M Kresch