Sandisk Technologies Inc.

Jeffrey Lee

Ali K Al-Shamma

Yingchang Chen

Yadhu Vamshi Vancha

Chang Hua Siau

Tz-Yi Liu

Anurag Nigam

Thomas Yan

Apparatuses, systems, methods, and computer program products are disclosed for a single pulse memory operation. An electrical source is configured to generate an electrical pulse. A selector for a memory cell is configured to conduct an electrical pulse from an electrical source to a memory cell in response to the electrical pulse exceeding a threshold. A control circuit is configured to maintain at least an operational level for the electrical pulse for a predefined time period to perform an operation on the memory cell.

Single pulse memory operation

A circuit or associated system or apparatus includes a first transistor, a second transistor, a first switch, a second switch, a first current source, and a third switch. The first transistor is configured to sample a first current of a control line. The second transistor is configured to apply a second current to the control line. The second transistor is also configured to match the second current to the first current. The first switch is connected in series between a control terminal of the first transistor and a control terminal of the second transistor. The second switch is connected in series between the second transistor and the control line. The third switch is connected in series between the first current source and the control line.

Fast voltage compensation without feedback

A method is provided for operating a non-volatile storage system that includes a plurality of bit lines, a word line comb including a plurality of word lines, and a plurality of memory elements, each memory element coupled between one of the bit lines and one of the word lines. The method includes receiving a current conducted by the word line comb, estimating a resistance of a conductive path between the word line comb and a selected word line voltage node, and generating a voltage at the selected word line voltage node based on the received current and the estimated resistance so that a voltage of the word line comb substantially equals a reference voltage.

Word line compensation for memory arrays

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Fremont, CA, United States of America

Jeffrey Lee