International Business Machines Corporation

Jeffrey Frank Kutner

John Saunders Corbin, Jr

David Lewis Gardell

Jose Arturo Garza, Jr

Howard Victor Mahaney, Jr

Kenneth Carl Larsen

John Joseph Salazar

Lonnie J Cannon

A chip testing system with improved thermal performance. In a preferred embodiment, a nest assembly of a chip testing apparatus includes tooling balls and a fitted frame for improving alignment of a coldplate and a chip surface. In preferred embodiments, the coldplate is of unibody design. Thermal performance is also improved by balancing the forces exerted on the coldplate using an adjustable hose mounting bracket. The bracket allows the forces exerted by the hoses on the coldplate to be adjusted so they balance and cancel other unwanted forces on the cold plate.

Apparatus for functional and stress testing of exposed chip land grid array devices

Growing community of inventors

Pleasant Valley, NY, United States of America

Jeffrey Frank Kutner