Altera Corporation

Jeffrey Christopher Chromczak

David Lewis

Ryan Fung

David Cashman

Herman Henry Schmit

Michael David Hutton

Sean R Atsatt

Valavan Manohararajah

Dana How

James Loran Ball

Carl Ebeling

David Galloway

Bee Yee Ng

Michael Chan

Eng Ling Ho

Gaik Ming Chan

Aron Joseph Roth

An integrated circuit may have pipelined programmable interconnects that are configured to select between a routing signal stored in storage nodes of a pipeline element and the identical routing signal bypassing the pipeline element. A programming element may access the storage nodes of the pipeline elements for write operations and, if desired, for read operations. For example, the programming element may perform write operations to initialize the storage nodes to a known state during power-up operations or to reset the pipeline element. In addition, the programming element may perform reed operations for debug and testing purposes.

Cross-point programming of pipelined interconnect circuitry

An integrated circuit device includes a first memory cell that stores data representative of configuration data when operating in a first mode, wherein the first memory cell stores data representative of user-accessible data when operating in a second mode. The integrated circuit device also includes a second memory cell that stores a value indicating whether the first memory cell is operating in the first mode or is operating in the second mode. The integrated circuit device further includes a switch coupled to the first memory cell and controlled by the second memory cell, wherein the switch provides a defined value to be read in place of the stored data of the first memory cell when the second memory cell stores the value indicating that the first memory cell is operating in the second mode.

Lutram dummy read scheme during error detection and correction

An integrated circuit may have configurable storage blocks. A configurable storage block may include a memory array, an arithmetic circuit, and a control circuit. The control circuit may be used to determine whether to operate the configurable storage block in a first mode which may provide random access to the memory array or in a second mode which may provide access to the memory array in a predefined order. Thus, the configurable storage block may implement first-in first-out modules, shift registers, or delay-line modules in addition to implementing memory modules with random access.

Configurable storage blocks with embedded first-in first-out and delay line circuitry

An integrated circuit may include user storage circuits and scan storage circuits. The scan storage circuits may store data from the user storage circuits and provide the data to a user interface during a read-back operation. The user storage circuits may store data from the scan storage circuits, which the scan storage circuits may have received from the user interface during a write-back operation. The scan storage circuits may be arranged in a scan chain and controlled by a local control circuit. The integrated circuit may include multiple local control circuits that each control a sector of the integrated circuit. The local control circuits may communicate with a global control circuit over a communication network, and the global control circuit may communicate with the user interface.

Techniques for using scan storage circuits

An integrated circuit may have pipelined programmable interconnects that are configured to select between a routing signal stored in a register and the identical routing signal bypassing the register. The pipelined programmable interconnect may send the selected routing signal over a wire to the next pipelined programmable interconnect circuitry. The integrated circuit may also have clock routing circuitry to select respective clock signals for the registers in the different pipelined programmable interconnects. The clock routing circuitry may include first interconnects that convey region clocks, second interconnects that conveys routing clocks, a first selector circuit to select routing clocks among the region clocks, and a second selector circuit to select routing clocks for the respective registers.

Clocking for pipelined routing

An integrated circuit (IC) includes a set of metastability-hardened storage circuits. Each metastability-hardened storage circuit may include: (a) a pulse width distortion circuit; (b) a first circuit powered by a nominal power supply voltage, and a second circuit powered by a higher-than-nominal supply voltage; (c) an inverter and a bias circuit, where the bias circuit provides a bias current based on an intermediate state of the inverter to resolve a metastable state of the inverter; or (d) a latch, and a dynamic bias circuit that causes current to be injected into the latch to resolve a metastable state of the latch.

Apparatus for using metastability-hardened storage circuits in logic devices and associated methods

An integrated circuit may have interconnect circuitry which may include a sequence of tiles. Each tile may be associated with a given tile type, and each tile type may include a predetermined routing of multiple wires on multiple tracks. Wires may change tracks within a given tile, which is sometimes also referred to as wire twisting. Wire twists may reduce the overlap between pairs of adjacent wires, thereby reducing the coupling capacitance between the respective wires. Reducing the coupling capacitance may result in reduced crosstalk between the wires which may speed up the signal transition along those wires. At the same time, the twist region height (i.e., the region in the tile in which wires are twisted) may be reduced compared to conventional interconnect circuitry.

Methods and apparatus for reducing crosstalk and twist region height in routing wires

Integrated circuits with sequential logic circuitry are provided. Sequential logic circuitry may include a chain of bypassable clocked storage elements coupled between a speed critical input terminal and a speed critical output terminal. Combinational logic circuits may be interposed between each adjacent pair of bypassable clocked storage elements in the chain. Dynamic voltage-frequency scaling (DVFS) control circuitry may provide an adjustable power supply voltage to the combinational logic circuits and may provide an adjustable clock signal to control the clocked storage elements. The DVFS control circuitry may be used to selectively enable at least some of the bypassable clocked storage elements while disabling other bypassable clocked storage elements so that the power supply voltage can be reduced while maintaining the same operating frequency. The power supply voltage and the frequency of the clock signal can be adjusted to provide the desired voltage-frequency tradeoff.

Bypassable clocked storage circuitry for dynamic voltage-frequency scaling

One embodiment relates to an integrated circuit including a multiple-voltage programmable logic fabric. The programmable logic fabric includes circuits of a first type operating in a first voltage domain and circuits of a second type operating in a second voltage domain. The second voltage domain has a lower supply voltage than the first voltage domain. The integrated circuit further includes downward level conversion circuit elements in the programmable logic fabric for driving signals from the first voltage domain to the second voltage domain and upward level conversion circuit elements in the programmable logic fabric for driving signals from the second voltage domain to the first voltage domain. Other embodiments, aspects, and features are also disclosed.

Multiple-voltage programmable logic fabric

A delay cell includes a feed-forward inverter and a feedback inverter. The feedback inverter is coupled to the feed-forward inverter. The feed-forward inverter has an input and an output. Similarly, the feedback inverter has an input and an output. A drive strength of the feed-forward inverter is larger than a drive strength of the feedback inverter such that a transition at the input of the feed-forward inverter propagates to the output of the feed-forward inverter.

Apparatus for controllable delay cell and associated methods

Configurable time-borrowing flip-flops may be based on configurable pulse generation circuitry and pulse latches. The circuitry may use a self-timed architecture that controls the width of clock pulses that are generated so that the pulse latches that are controlled by the clock pulses exhibit a reduced risk of race through conditions. Latch circuitry may be provided that is based on a pulse latch and an additional latch connected in series with the pulse latch. In situations in which there is a potential for race through conditions on an integrated circuit, the additional latch may be switched into use to convert the latch circuitry into an edge-triggered flip flop. Clock trees may be provide with configurable shorting structures that help to reduce clock skew. Low-contention clock drivers may drive signals onto the clock tree paths.

Robust time borrowing pulse latches

Integrated circuits with pulse latches are provided. Pulse latches are controlled by clock pulse signals. The clock pulse signals are generated by pulse generators. The pulse generators are controlled by adaptive pulse width control circuitry to provide clock pulse signals with a minimum pulse width and with sufficient margin to tolerate for process, voltage, and temperature variations. The pulse width control circuitry may include a replica pulse generator, a test data generation circuit, a test latch, and a pulse width calibration circuit. The replica pulse generator controls the test latch. The test latch may attempt to latch the test data. The pulse width control circuit may determine if the test latch properly latches the test data with the given pulse width. The pulse width control circuit adjusts the pulse generator dynamically to provide a minimized pulse width.

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Brownsville, CA, United States of America

Jeffrey Christopher Chromczak