Illumina Corporation

Jeffrey Bendick

David E Hargis

Simon Prince

Danilo Condello

Christophe Sigel

John O'shauhnessy

David Hargis

Peter Clarke Newman

John O'Shaughnessy

William Butterfield

Systems and methods disclosed herein include an imaging system that may include a laser diode source; an objective lens positioned to direct a focus tracking beam from the light source onto a location in a sample container and to receive the focus tracking beam reflected from the sample; and an image sensor that may include a plurality of pixel locations to receive focus tracking beam that is reflected off of the location in the sample container, where the reflected focus tracking beam may create a spot on the image sensor. Some examples may further include a laser diode light source that may be operated at a power level that is above a power level for operation at an Amplified Spontaneous Emission ('ASE') mode, but below a power level for single mode operation.

Systems and methods for improved focus tracking using a hybrid mode light source

Systems and methods disclosed herein include an optical blocking structure that may include a frame defining an aperture, first and second elongate structural members each comprising first and second ends such that the first and second elongate structural members may be connected at their first ends to opposite sides of the aperture, and further such that the first and second elongate structural members may extend from the frame parallel to and in the same direction as one another; and an optically opaque blocking member positioned to extend between the respective second ends of the first and second blocking members.

Systems and methods for improved focus tracking using blocking structures

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San Diego, CA, United States of America

Jeffrey Bendick