Corning Incorporated

Jeffrey Allen Knowles

Correy Robert Ustanik

Jiaxiang Zhang

Methods for detecting defects on the surface of a sheet of material include collimating a beam of light and intersecting the collimated beam of light with a beam splitter. The beam splitter directs a first portion of the intersected beam of collimated light to illuminate a first surface of the sheet, wherein a first portion of the light illuminating the first surface is reflected and a second portion of the illuminating light is scattered by a defect. The reflected and scattered light is received with a first lens element that directs the reflected and scattered light to an inverse aperture. The reflected light is blocked by the inverse aperture and the scattered light is transmitted by the inverse aperture. The scattered light transmitted by the inverse aperture is directed with a second lens element to an imaging device.

Growing community of inventors

Campbell, NY, United States of America

Jeffrey Allen Knowles