Hewlett Packard Enterprise Development LP

Jeffrey Alan Lucas

Brent Buchanan

Martin Foltin

Richard H Henze

James Ignowski

Clinton Harold Parker

Tommy Miles

William L Wilson

In example implementations, an integrated characterization vehicle is provided. The integrated characterization vehicle includes a memristor, a configuration cache and an analog measurement tile. The memristor has a driving unit to limit an amount of current that is driven through the memristor during testing. The configuration cache provides test parameters to control the testing of the memristor. The analog measurement tile provides a voltage to the memristor in accordance with the test parameters and to record a response of the memristor.

Integrated characterization vehicles for non-volatile memory cells

An apparatus includes a first resistive storage element and a second resistive storage element. The first and second resistive storage elements are coupled to column lines to of a crosspoint array to form a memory cell; and a ratio of resistances of the first and second resistive storage elements indicates a stored value for the memory cell.

Resistive ratio-based memory cell

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Fort Collins, CO, United States of America

Jeffrey Alan Lucas