Massachusetts Institute of Technology

Johns Hopkins University

The Charles Stark Draper Laboratory, Inc.

Jeffery W Warren

Thomas F Marinis

Michael F McManus

Richard D Elliott

Peter G Sherman

Ryan P DiNello-Fass

Matthew S Bottkol

Charles H Lange

Scott B Goldblatt

Michael Y Feng

Steven J Conard

Shan Mohiuddin

John E Pritchett

A micro-electro-mechanical systems (MEMS) inertial measurement system facilitates accurate location and/or attitude measurements via passive thermal management of MEMS inertial sensors. Accuracy of the system is also improved by subjecting the inertial sensors to programmed single-axis gimbal motion, and by performing coarse and fine adjustments to the attitude estimates obtained by the system based on the programmed motion and on the passive thermal management of the sensors.

Inertial measurement systems, and methods of use and manufacture thereof

An alignment suite includes first and second targeting devices and an optical coupler. The first targeting device is configured to perform a positional determination regarding a downrange target. The first targeting device includes an image processor. The second targeting device is configured to perform a targeting function relative to the downrange target and is affixable to the first targeting device. The optical coupler enables the image processor to capture an image of a reference object at the second targeting device responsive to the first and second targeting devices being affixed together. The image processor employs processing circuitry that determines pose information indicative of an alignment relationship between the first and second targeting devices relative to the downrange target based on the image captured.

Automatic device alignment mechanism

Growing community of inventors

Ellicott City, MD, United States of America

Jeffery W Warren