Micron Optics, Inc.

Jeff W Miller

Calvin M Miller

Kevin Hsu

Yufei Bao

David Daugherty

Todd C Haber

Tom Q Y Li

A method for calibrating tunable optical filters, calibrated tunable filters and devices employing such filters. The method is of particular use with fiber Fabry-Perot tunable filters and more particularly for filters which employ piezoelectric transducers as tuning elements. Sets of calibration coefficients are generated which span the wavelength region and operating temperature range of the filter. Calibrated tunable filters are combined with a means for storing the sets of calibration coefficients and means for correcting wavelength measurements using the sets of coefficients in devices which measure wavelengths of light. The sets of calibration coefficients can also be used to tune the filter to pass a selected wavelength of interest.

Calibrated tunable fiber fabry-perot filters for optical wavelength scanners and optical spectrum analyzers

Swept-wavelength lasers with accurately calibrated wavelength output which can be very rapidly scanned or swept over a selected wavelength band. The invention provides lasers that generate wavelengths in the 1550 nm range that can be swept over about 50 nm. These swept-wavelength lasers are generally useful as accurately calibrated high power light sources. Calibration is achieved by use of a calibrated reference system. Swept-wavelength lasers are particularly useful as components of sensor interrogator systems which determine wavelengths reflected (or transmitted) by Fiber Bragg Gratings (FBG) in sensor arrays. Swept wavelength lasers of this invention are also generally useful for testing of WDM systems, particularly for their applications to current communication systems. the invention provides lasers, interrogator systems and systems for testing WDM components employing the lasers as a calibrated light source. The invention also provides methods for calibrating a swept-wavelength laser using the wavelength reference system provided herein as well as methods for detecting wavelengths in an optical signal or output using the interrogator systems provided herein. The invention further provides methods for testing the performance of WDM components using the testing systems provided herein.

Calibrated swept-wavelength laser and interrogator system for testing wavelength-division multiplexing system

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Kennesaw, GA, United States of America

Jeff W Miller