Skhynix Inc.

Hynix Semiconductor Inc.

Jeff Rysinski

Yibing Michelle Wang

Sang-Soo Lee

Hongyu Wang

Aspects of the invention may comprise receiving a first input signal and a second input signal via respective first and second input transistors. A biasing signal, generated by a cascode bias generator, that tracks the first input signal, where the biasing signal has a fixed offset with respect to the first input signal. The biasing signal may be applied to the first and second cascode transistors that may be cascoded to the first and second input transistors, respectively.

Cascoded comparator with dynamic biasing for column parallel single slope ADCs

Aspects of the invention may include receiving a first input signal and a second input signal via respective first and second input transistors. A biasing signal, generated by a cascode bias generator, tracks the first input signal, where the biasing signal has a fixed offset with respect to the first input signal. The biasing signal may be applied to the first and second cascode transistors that may be cascoded to the first and second input transistors, respectively.

An image processing system includes a pixel array including a plurality of regular pixel columns and at least one test pixel column, a plurality of column analog-to-digital converters (ADCs) configured to correspond to the regular pixel columns and convert analog input signals into digital signals, and a switching block configured to provide output signals of the regular pixel columns to input ends of the corresponding column ADCs in a normal mode, and provide in common an output signal of the test pixel column to the input ends of the column ADCs in a test mode, wherein the test pixel column generates signals having a minute voltage different from one row to another row.

Image processing system with on-chip test mode for column ADCs

A system for processing images may comprise a pixel configuration circuitry enabled to set for each pixel in a pixel array one of a plurality of integration times and one of a plurality of signal gains. A column analog-to-digital converter may be enabled to generate a corresponding digital data for a pixel in the pixel array, and digital processing circuitry may be enabled to interpolate output data from the corresponding digital data for pixels grouped into pixel groups, wherein the pixel group comprises a target pixel and neighboring pixels in a same color plane.

Dynamic range extension for CMOS image sensors for mobile applications

Aspects of the invention provide dynamic range extension for CMOS image sensors for mobile applications. An embodiment of the invention may comprise setting for each pixel in a pixel array one of a plurality of integration times and one of a plurality of signal gains, wherein the settings may be used to generate corresponding digital data for each pixel in the pixel array. The corresponding digital data for adjacent pixels for the same color plane may then be grouped into a superpixel, where each pixel has associated with it a different combination of integration time and signal gain.

Various embodiments of the present invention include enabling, during a calibration phase, a counter to count one less than a number of clock periods associated with a determined offset. The counted number of the clock periods is stored in calibration memory. In a conversion phase, inverted outputs are loaded from the calibration memory to the counter, where the counter is enabled to count the clock periods to determine a digital equivalent value of an analog signal amplitude.

Automatic offset adjustment for digital calibration of column parallel single-slope ADCs for image sensors

Various embodiments of the invention include enabling, during a calibration phase, a counter to count one less than a number of clock periods associated with a determined offset. The counted number of the clock periods is stored in calibration memory. In a conversion phase, inverted outputs are loaded from the calibration memory to the counter, where the counter is enabled to count the clock periods to determine a digital equivalent value of an analog signal amplitude.

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Pasadena, CA, United States of America

Jeff Rysinski