USA As Represented by Secretary of the Navy

American Competitiveness Institute, Inc.

Jeff K Latham

Alex E Cragoe

Michael D Frederickson

Richard Walter Hirthe

Martin Arthur Seitz

Patrick D Riggs

Mohammad N Amin

Anthony L Delieto

This invention relates to an on-line statistical process control device for solder paste and residues. The invention consists of electronics hardware, software, and probing systems. The electrical hardware of the invention provides voltage and current measurements of solder paste materials, the software of the invention controls the hardware, provides real-time complex, non-linear least squares curve fitting for equivalent circuit analysis, data storage and retrieval of circuit parameters and behavior, and statistical process control tracking and charting. The probing systems of the invention allows for 2, 3, and 4 probe surface and bulk measurements of the solder paste and residues.

Solder paste and residue

An impedance spectroscopy system characterizes the rheologic and thixotropic properties of solder paste and residues by measuring its impedance at various frequencies. The impedance spectroscopy system provides voltage and current inputs to a sample at various frequencies and measures the resulting impedance. The impedance spectroscopy system stores equivalent circuit parameters for multiple solder pastes and residues, controls the voltage and current inputs to the sample, displays measurement data in real-time, displays results, and notifies the operator if results exceed preset limits.

Impedance spectroscopy measurement system

This invention relates to an on-line statistical process control device for solder paste and residues. The invention consists of electronics hardwa software, and probing systems. The electrical hardware of the invention provides voltage and current measurements of solder paste materials, the software of the invention controls the hardware, provides real-time complex, non-linear least squares curve fitting for equivalent circuit analysis, data storage and retrieval of circuit parameters and behavior, and to statistical process control tracking and charting. The probing systems of the invention allows for 2, 3, and 4 probe surface and bulk measurements of the solder paste and residues.

Solder paste and residue measurement system

This invention relates to an on-line statistical process control device for solder paste and residues. The invention consists of electronics hardware, software, and probing systems. The electrical hardware of the invention provides voltage and current measurements of solder paste materials, the software of the invention controls the hardware, provides real-time complex, nonlinear least squares curve fitting for equivalent circuit analysis, data storage and retrieval of circuit parameters and behavior, and statistical process control tracking and charting. The probing systems of the invention allows for 2, 3, and 4 probe surface and bulk measurements of the solder paste and residues.

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New Castle, IN, United States of America

Jeff K Latham