Advanced Micro Devices Corporation

Jeff Brinkley

Steven R Klassen

Chandrakant Pandya

Trent Johnson

John Heon Yi

Satwant Singh

Glenn Eubank

Michael Gregory Tarin

A burn-in test system. A burn-in test system includes a device under test (DUT), a temperature controller coupled to the DUT, and a test controller. During testing, the test controller: (a) sets a parameter of the DUT to a first value and applies a test stimulus to the DUT, and (b) sets the parameter of the DUT to a second value and applies the test stimulus to the DUT. A change in the value of the parameter results in a change in the amount of heat dissipated by the DUT. The temperature controller maintains the DUT at a pre-determined temperature during testing with the parameter set to both the first and the second values. The DUT may be further coupled to a module that comprises circuitry employed in a product-level application environment. The module is configured by the test controller to simulate a product-level application.

Burn-in using system-level test hardware

Growing community of inventors

Georgetown, TX, United States of America

Jeff Brinkley