Amazon Technologies, Inc.

Jeevan Shankar

Danny Wei

Marc Stephen Olson

James Michael Thompson

Nachiappan Arumugam

Benjamin Arthur Hawks

John Robert Smiley

John Luther Guthrie

Systems and methods are described providing detailed input/output (I/O) metric information that is collected and gathered by an agent of the storage volume. An I/O request is received by a storage volume, and the agent associates primary and secondary identifiers with that I/O request. For example, a trace may be associated with that I/O request. The agent may store this I/O metric information in a ring buffer. Further, after collection and aggregation, statistics may be published by an I/O metric service that further processes the data provided by the agent. Advantageously, interdependent relationships associated with the I/O request or I/O operations of that request may be included in those statistics. This may allow an operator to evaluate the performance of I/O requests for a network.

Managing I/O requests

Systems and methods are described for dynamically detecting outliers in a set of input/output (I/O) metrics collected and aggregated by a storage volume network. An I/O request is received by a storage volume network, and an agent of the storage volume network associates primary and secondary identifiers with that I/O request. For example, a trace may be associated with a request to write data to a storage volume network, and spans may be associated with the individual operations required to fulfill that request. Once gathered, I/O metrics may be aggregated based on the associated identifiers. I/O metric information regarding outliers may be received from the storage volume network, processed, and published by an I/O metrics service to identify the outliers among the primary and secondary identifiers. These outliers may then be stored for further analysis, and may be utilized to determine improvements to the performance of a storage volume network.

Computer system for managing I/O metric information by identifying one or more outliers and comparing set of aggregated I/O metrics

Growing community of inventors

Amherst, MA, United States of America

Jeevan Shankar