General Electric Company

Jean-Philippe Choiniere

John Karigiannis

Stephane Harel

Steeves Bouchard

Bernard Patrick Bewlay

David Scott Diwinsky

Ser Nam Lim

Arpit Jain

Xiao Bian

David Cantin

Maxime Beaudoin Pouliot

Nicolas Saudrais

Marc-Andre Marois

An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.

System and method for work piece inspection

A system includes one or more processors configured to create a projection matrix based on a three-dimensional (3D) model of a part and sensor data associated with a workpiece in a workspace of a robotic manipulator. The projection matrix provides a mapping between sensor coordinates associated with the sensor data and 3D coordinates associated with the 3D model. The one or more processors are configured to identify a set of sensor coordinates from the sensor data corresponding to a feature indication associated with the workpiece, and to determine from the set of sensor coordinates a set of 3D coordinates using the projection matrix.

Robotic feature mapping and motion control

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Bromont, Canada

Jean-Philippe Choiniere