Wilton Industries, Inc.

The Dial Corporation

Redlen Technologies, Inc.

Jean Marcoux

Francois Duval

Gad Shaanan

Patrick Mainville

Derek Hunziker

Yvan Brousseau

Ivan Brousseau

Krzysztof Iniewski

Gregory Schriner

Paul A Pappalardo

Conny Hansson

Marc Drucker

Elmaddin Guliyev

Georgios Prekas

Vanessa Kamerer

Walter Francovich

Michael Rozler

A set of N standard bin count distributions may be generated by irradiating a test radiation detector system with an X-ray beam attenuated by a respective one of N different K-edge filters for each of the at least one X-ray source energy setting. Energy bins of detectors of a target radiation detector system may be calibrated by generating measured bin count distributions for each calibration setting in which a respective one of the N different K-edge filters attenuates a source X-ray beam. Calibration parameters of the detectors of the target radiation detector system may be adjusted to match each of the measured bin count distributions to a corresponding standard bin count distribution. In addition, energy resolution of the radiation detectors can be measured and calibrated by fitting a portion of the measured X-ray spectrum near a K-edge to a fitting function.

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Montreal, Canada

Jean Marcoux