Commissariat a L'energie Atomique

Compagnie Generale Des Matieres

Commissariat &#xc0; L'&#xc9;nergie Atomique Et Aux &#xc9;nergies Alternatives

Compagnie Generale Des Matieres Nucleaires

Synchrotron Soleil

Jean-Luc Lacour

Olivier Sublemontier

Patrick Mauchien

Pascal Fichet

Daniel L'Hermite

Jean-Baptiste Sirven

Vincent Detalle

Annie Rivoallan

Jean-François Wagner

Christophe Nicolas

Flory-Anne Barreda

Emmanuel Robert

Nadège Caron

Kévin Beranger

A method for physicochemical analysis of a material during its ablation with a pulsed laser. The method uses the ratio of intensity levels of two emission lines of a tracer element derived from plasma generated by the laser beam to characterize the plasma excitation temperature. The method determines concentration of an element to be measured in the plasma using standard measurements indicating correspondence between a concentration of the element to measured and a variation of intensity of an emission line and different ratios between intensity levels of two emission lines of the tracer element, the ratios representing the plasma temperature.

Method and system for physicochemical analysis using a laser pulsed ablation

A method for spectroscopy of the optical emission of a liquid excited by a pulsed laser focused on the surface thereof is such that the area of analysis is scanned by a laminar discharge of gas whose velocity and section are such that it is possible to remove the residues of the plasma suspended in the gas, resulting from a first laser pulse, before the subsequent laser pulse occurs.

Method and apparatus for spectroscopy of the optical emission of a liquid excited by a laser

This device comprises a pulsed laser source (), means () for focusing light from this source onto an object to be analysed () to produce plasma on the surface of the object, means () of analyzing a plasma radiation spectrum, means () of determining the elementary composition of the object from this analysis, and possibly means () for displacing the object. The invention is particularly applicable to test radioactive materials.

Elementary analysis device by optical emission spectrometry on laser produced plasma

Growing community of inventors

Villebon sur Yvette, France

Jean-Luc Lacour