U.S. Philips Corporation

Alcatel N.v.

Jean Le Bris

Marko Erman

Claude E Hily

Gerard Gillardin

Jean-Pierre Cabanie

To enable surface tension forces to confer upon an optical fiber end (P1), a shape procuring good optical coupling the end is partially melted in an electric arc (ZC). To improve the reproducibility of this shape movement into the arc is achieved by a unidirectional sideways displacement (MC) of the fiber at an angle to the optical fiber axis. The invention applies to coupling a flat array of optical fibers to a strip of components such as semiconductor lasers. To this end the fibers (F1, . . . , F6) are fixed into grooves on a fiber support (2). The latter is displaced to dip the fiber ends simultaneously into a chemical etching bath which gives them a pointed shape and then to move them successively into the electric arc.

Method of forming coupling diopters at the ends of optical fibers

A device is described for characterizing wafers of semiconductor materials by photoluminescence with high spatial resolution and at low temperature, this device comprising at least:

Device for characterizing semiconductor samples by photoluminescence

A spectroscopic ellipsometer comprises an illumination device having a focal point (F'.sub.2) for illuminating a surface of a sample (E) in accordance with a given angle of incidence and a device for analyzing the light reflected from the surface of the sample. The sample support comprises three translation plates (20,30,40) in accordance with three respective directions (T.sub.2, T.sub.3, T.sub.1). The translations in accordance with the first (T.sub.1) and second (T.sub.2) directions make it possible to realise cartographic representations of the sample (E) and the translation in accordance with the third direction (T.sub.3) makes it possible to cause a point on the surface of the same (E) to coincide with the focal point (F'.sub.2). Two plates (PT.sub.2, 12) rotating about the axes O.sub.1 and O.sub.2, respectively, parallel to the first (T.sub.1) and second (T.sub.2) directions and intersecting each other at the focal point (F'.sub.2) provide the possibility of orienting the sample (E) by means of rotation in two orthogonal planes about the focal point (F'.sub. 2).

Spectroscopic ellipsometer

The invention relates to an optical sample illumination device for a spectroscopic ellipsometer of the rotating analyzer type. The image of the exit slit (F') of a monochromator is conjugated with a point (F'.sub.2) of a surface of a sample (E) by means of two spherical mirrors (M.sub.7 and M.sub.8). An astigmatism correction slit (F'.sub.15) is arranged in the proximity of the conjugate (F'.sub.1) of the exit slit(F') of the monochromator with respect to the spherical mirror (M.sub.7) and is arranged perpendicularly to this exit slit and to the optical path so that said correction slit is conjugated with the said point (F'.sub.2) through the spherical mirror (M.sub.8). A luminous spot without astigmatic errors is thus obtained.

Optical sample illumination device for a spectroscopic ellipsometer

An optical coupling device for coupling a first optical waveguide having an end face and transmitting a number N of signals of different wavelengths with a number N of further optical waveguides having end faces and each transmitting one of these signals comprises means for the spectral selection of these signals, which means include a wavelength separator with interference filters, and means for the spatial selection of these signals in order to achieve this coupling. According to the invention all of the end faces are situated in the same plane P, said means comprise N spherical surfaces situated after each other, the (N-1) first spherical surfaces relative to the plane P being provided each with one of said interference filters the spherical surface which is remotest from the plane P being provided with either a totally reflecting or with an interference filter and the of curvature of the spherical surfaces being situated in the plane P midway the end face of the first optical waveguide and one of the end faces of the further optical waveguides.

Growing community of inventors

Quincy Sous Senart, France

Jean Le Bris