Compagnie Industrielle Des Lasers Cilas

Compagnie Industrielle Des Lasers

Compagnie Generale D'electricite

Compagnie Industrielle Des Lasers Cilas Alcatel

Jean Cornillault

Victor Victorovich Apollonov

Jean Robieux

Alexander Mihailovitch Prokhorov

Aleksandr Mikhailovitch Prokhorov

Dmitry Alecsandrovich Mashkovsky

Vladmir Ivanovitch Acsinin

Vitali Vladimirovitch Kouzminov

Victor Pavlovich Smekalin

Guennadi Ivanovitch Babaiants

Yury Petrovich Koval

Viktor Pavlovitch Smekaline

Sergey Igorevich Derjavin

Youri Petrovitch Koval

Victor Ivanovitch Kislov

Serguei Igorevitch Derjavine

Vadim Veniaminovitch Kiyko

Thierry Jean Foucher

Alexandr Mikhaylovich Prokhorov

Jean-Louis Duvent

Vitaliy Vladimirovich Kuzminov

Dmitri Aleksandrovitch Machkovski

Batory Shakhimovich Kishmakhov

Viktor Viktorovitch Apollonov

Yuri Lvovitch Kalachev

Gennadiy Ivanovich Babayants

Antoine Bettinger

Jean-Pierre Potier

Christian Tabaillon

Batori Chakhimovitch Kichmakhov

Alexis Borissovitch Egorov

A device for adjusting the lateral position of at least one part of a moving machine for constructing a structure on a terrain includes a measuring device, at least one sensor, a positioning system and a computer adapted to determine theoretical and actual transverse positions of the part of the machine and to command the positioning system in such manner as to render the theoretical and actual transverse positions coincident.

Method and device for adjusting the transverse position of a moving machine

Laser-diode device including heat-conducting walls, semiconductor strips

A diode laser device includes a heat diffusing substrate made from a material that is a good conductor of heat, in one face of which is formed a system of parallel ribs and grooves, the ribs being identical and equidistant, and a plurality of semiconductor arrays incorporating the diodes and housed longitudinally in the grooves. The grooves have an at least approximately triangular cross-section joined to the substrate by one side and each semiconductor array is fixed flat to an oblique flank of one of the ribs.

Diode laser device arranged in the form of semiconductor arrays

A mirror having a reflection coefficient that is spatially variable in amplitude and in phase includes at least two parallel spaced reflecting plates. One of the plates is displaced parallel to itself to vary the distance between the plates. At least one of the reflecting plates can be deformed transversely to its plane.

Mirror with reflection coefficient variable spatially in amplitude and

Optical system having application to robotics for determining an object's position. The present system consisting of a laser generator 1 with, devices 11 modulating the wavelength of laser generator frequency along an ascending ramp. An optical system 8 for concentrating radiation near the object, receiver 16 picks up a luminous signal transmitted by the object 10 and reflected on to an optical lamp 6. A processing circuit 17 measures the time in which elapses between the beginning of the shift in wavelength and the moment when the luminous signal is picked up by the receiver.

Optical system for determining an object's position

A source of light (F1, 34) directs a light beam (35) towards an object. A photoelectrical measuring system (39) includes three measurement detectors (40, 41, 42) having respective reception fields (44, 45, 46). These fields overlap partially, and all of them share a volume of space in common with the beam (35). A reference photoelectrical system (F2, 36) detects light diffused by an object anywhere in said common volume. A processing system determines the distance of the object in said common field as a function both of which of the measurement detectors is detecting light diffused by the object and of the ratio between the measurement signal detected thereby and the reference signal from the reference system. The apparatus may be used to equip the pincers of an industrial robot.

Apparatus for measuring the position of an object

The invention relates to a device for determining the granulometric composition of a mixture of particles by diffraction of light. The light flux received on the diffraction pattern is measured in a number of diffraction areas (AI,AJ) each of which is in the shape of an angular sector of circular rings which are concentric with the pattern, these integration areas forming two successions in each of which the inner and outer radii form geometrical progressions with common ratio of two, the ratio between the outer radius and the inner radius of an integration area being chosen in the interval between two and the square root of two, the radii within one succession (AJ) being equal to those within the other (AI) multiplied by the square root of two. Application to studying powder mixtures.

Device for determining the granulometric composition of a mixture of

A device for determining the profile of a surface is disclosed. It comprises a beam arranged in a rotating plane about an axis of rotation, forming on the surface a light spot and scanning a sector of that plane. A detection system whose detection axis is situated in that plane cuts the beam near the surface and a system for measuring the angle formed by the axis of detection and the beam during the scanning when the light spot is situated on the detection axis is utilized.

Device for determining the profile of a surface

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Nozay, France

Jean Cornillault