Centre National De La Recherche Scientifique

Universitë De Bordeaux

National University of Singapore

Imagine Optic

Jean-Baptiste Sibarita

Vincent Studer

Xavier Levecq

Remi Galland

Virgile Viasnoff

Virgile Nicolas Robert Viasnoff

Rémi Galland

Gianluca Grenci

A sample holding device for use in transverse illumination of a sample or sub-components of a sample comprising: a support substrate comprising a sample well adapted to contain and be compatible with said sample wherein said well is provided on at least one wall with an angled reflective surface adjacent said sample well which when in use directs a transverse light beam from a light source through a sample contained within said sample well to provide substantially transverse illumination of a sample contained therein and imaging the sample using a single objective.

Micro-textured surface with integrated micro-mirrors for 3D multi-scale microscopy

Accurate localization of isolated particles is important in single particle based super-resolution microscopy. It allows the imaging of biological samples with nanometer-scale resolution using a simple fluorescence microscopy setup. Nevertheless, conventional techniques for localizing single particles can take minutes to hours of computation time because they require up to a million localizations to form an image. In contrast, the present particle localization techniques use wavelet-based image decomposition and image segmentation to achieve nanometer-scale resolution in two dimensions within seconds to minutes. This two-dimensional localization can be augmented with localization in a third dimension based on a fit to the imaging system's point-spread function (PSF), which may be asymmetric along the optical axis. For an astigmatic imaging system, the PSF is an ellipse whose eccentricity and orientation varies along the optical axis. When implemented with a mix of CPU/GPU processing, the present techniques are fast enough to localize single particles while imaging (in real-time).

Method and apparatus for single-particle localization using wavelet analysis

According to one aspect, the invention concerns a method for microscopy of a thick sample arranged on a sample support, with edge-illumination of the sample. The method comprises, in particular, emitting at least one illumination beam (), forming, from the illumination beam, an illumination surface, focusing the illumination surface in the sample by means of a microscope lens () and deflecting the illumination surface originating from the microscope lens, in order to form a transverse illumination surface, located in a plane substantially perpendicular to the optical axis of the microscope lens. The method further comprises forming, by means of said microscope lens (), the image of an area of the sample illuminated by the transverse illumination surface on a detection surface () of a detection device (), scanning the illumination beam, allowing the transverse illumination surface to move along the optical axis of the microscope lens, and superimposing the object imaging surface and the transverse illumination surface, by focusing means comprising means separate from the means for the relative axial movement of the microscope lens and the sample.

System and method of edge-illumination microscopy

Growing community of inventors

Paris, France

Jean-Baptiste Sibarita