Samsung Electronics Co., Ltd.

Je Hyun Lee

Dae Sin Kim

Jeong Hoon Ko

Min Chul Park

Jae Hyun Park

Ki Won Lee

Ji Yong Park

Seong Je Kim

Zhiliang Xia

Sat Byul Kim

Woo Hyuk Jang

Jong Wook Jeon

Hey Young Park

Seong Ryeol Kim

Jong Kyu Bae

Sae Jin Kim

Jong Yeol Choi

Ki Young Lim

Yeo Rok Yoon

A method for analyzing a wafer map using a wafer map analyzer includes generating first wafer maps each displaying characteristics of a first wafer for a corresponding channel of a plurality of channels. The first wafer maps are auto-encoded together to extract a first feature. The method also includes determining whether the first feature is a valid pattern, classifying the type of the first feature based on unsupervised learning when the first feature is a valid pattern and extracting a representative image of features classified into the same type as the first feature.

Wafer map analyzer, method for analyzing wafer map using the same and method for manufacturing semiconductor device

A yield prediction apparatus is provided. The yield prediction apparatus may include at least one processor coupled to at least one non-transitory computer-readable medium. The at least one processor may be configured to receive a first variable associated with operating characteristics of a semiconductor device, perform a simulation for the operating characteristics of the semiconductor device, perform a neural network regression analysis using a result of the simulation to determine a first function for the first variable, and predict a yield of the semiconductor integrated circuit based on an advanced Monte Carlo simulation. An input of the advanced Monte Carlo simulation may include the determined first function.

Apparatus for predicting yield of semiconductor integrated circuit and method for manufacturing semiconductor device using the same

Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.

Grain analyzing method and system using HRTEM image

A server is provided comprising a processor configured to: receive an indication of a location of a first device that is subscribed to a disaster notification service; in response to receiving a disaster alert, detect that the first device is located in an area associated with the disaster based on the indication of the location of the first device; identify a second device that has registered the first device as a friend; and transmit a first indication of the disaster to the first device and a second indication of the disaster to the second device.

Method and apparatus for disaster notification

Growing community of inventors

Suwon-si, South Korea

Je Hyun Lee