Sun Microsystems, Inc.

Altera Corporation

Jaya Prakash Samala

Ishwardutt Parulkar

Gajendra Prasad Singh

Sridhar Narayanan

Subramani Kengeri

David Walter Carr

Paul Nadj

Error checking and correcting (ECC) is performed on data held in a content addressable memory. An error check circuit receives words from a memory circuit or circuits, generates an error status and generates a corrected value when appropriate. A control circuit sequences through each of the words of the memory circuit(s), periodically reads from the memory circuit the next word in the sequence and provides the next word to the error check circuit. The bandwidth consumed by the periodic error check phase can be controlled by adjusting the interval between reads.

Error checking and correcting for content addressable memories (CAMs)

A dynamic flip-flop includes a first input latch coupled to receive a data input signal and a second input latch coupled to receive the complement of the data input signal. The first input latch has a first shutoff mechanism and the second input latch has a second shutoff mechanism. During a precharge phase, the first and second input latches each provide an output signal. During an evaluation phase, the first and second input latches sample the data input signal and complemented data input signal if a compare enable signal is activated. The shutoff mechanisms as well will then only activate if the compare enable signal is activated. This allows the circuit to save power because flip-flop will not execute a compare during each clock cycle.

System and method of operating a dynamic flip-flop in power down mode with shut-off circuit

A boundary scan cell design which places the multiplexor before the functional flip-flip on the functional line path, reducing the multiplexor delay in the critical path. This optimizes the multiplexor and functional flip-flop orientation, allowing for a significant reduction in the time required from output of the functional flip-flop to a pin or to the interior of the CPU (the clock to q delay). In order to ensure that boundary scan mode functions properly, the functional flip-flop may be designed to act as a buffer, i.e. become transparent, when the boundary scan cell is in boundary scan mode.

Method for operating a boundary scan cell design for high performance I/O cells

Boundary scan cell design for high performance I/O cells

Dynamic flop with power down mode

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Jaya Prakash Samala