Augat Inc.

Jay T Goff

David W Mendenhall

Mark E Lewis

Neil J Cotter

Steve P Marian

Steve R Corbesero

A high density land grid array test socket comprises a leadless component contact socket assembly and a fixture. The contact socket assembly can be assembled with a variety of contact terminal end configurations and adapted for a desired mode of circuit board interface. In one embodiment, the test socket fixture includes a latching mechanism and a hinged lid assembly which allow quick and reliable manual installation of a device under test (DUT). An alternative embodiment includes snap latches, extension springs and alignment bushings which permit robotically controlled insertion and removal from the test socket. A bias clip or spring is incorporated in the test sockets for assuring proper alignment of the chip carrier with the contact socket assembly. The test socket creates reliable contacts with short electrical paths for low signal distortion and reduced chip loading.

High density grid array test socket

A flex dot wafer probe having utility as an electrical interface between semiconductor wafers and electronic test systems for determining the electrical integrity and performance of integrated circuits. The wafer probe comprises a wafer probe head having a preformed resilient, bendable, formable film mounted on a support member for flexible movement. The wafer probe head is integrated with a probe board which interfaces with an external test system. Wafer contact pads and protrusions are formed on the film in 'mirror-image' patterns corresponding to the contact elements of the integrated circuits and interface contact pads of the probe board, respectively. Coplanar line conductors, formed to control the characteristic impedance of the wafer probe head, provide electrical continuity between the wafer contact pads and the protrusions. The conductive protrusions formed on the wafer contact pads and the film physically and electrically engage the contact elements of the integrated circuits and the probe board, respectively, thereby providing electrical paths for test signals between the external test system and the integrated circuits. The flexible configuration of the wafer probe head ensures that all protrusions are forcibly urged into physical and electrical engagement with the corresponding external contact elements at an acceptable force level which precludes deformation of the protrusions.

Flex dot wafer probe

A high density backplane (HDB) connector is provided for electrically interconnecting high density printed circuit boards. The printed circuit boards have a predetermined geometric conductive pattern which includes high density arrays of individual signal/power contact interconnects and unitary ground strips. The HDB connector comprises a housing module secured to one board and a stiffener module secured to a second board. A compliant contact module mounted within the housing module includes a resilient member, an insulator member having arrays of free-floating rigid contact pins disposed therein, and a flexile film interposed therebetween. The flexile film has a signal/power conductive matrix formed on one side and a continuous ground plane formed on the other side. The compliant contact module further includes prestressed early-mate ground contacts and a plurality of distributed resilient ground contacts. Circuit board mating is effected by pressing the stiffener module down onto the housing module. The prestressed early-mate ground contacts exert forces to bias the second board away from the rigid contact pins. Further downward movement of the stiffener module causes a camming coaction between the stiffener module and the housing module to urge the second board into mating engagement with the rigid contact pins and the distributed resilient ground contacts. Final downward movement of the stiffener effects a wiping action between contact interconnects.

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Cranston, RI, United States of America

Jay T Goff