Ignis Innovation Inc.

Javid Jaffari

G Reza Chaji

Tong Liu

Stefan Alexander

Yaser Azizi

Arokia Nathan

Gholamreza Chaji

Joseph Marcel Dionne

Abbas Hormati

Abdorreza Heidari

A voltage-programmed display system allows measurement of effects on pixels in a panel that includes both active pixels and reference pixels coupled to a supply line and a programming line. The reference pixels are controlled so that they are not subject to substantial changes due to aging and operating conditions over time. A readout circuit is coupled to the active pixels and the reference pixels for reading at least one of current, voltage or charge from the pixels when they are supplied with known input signals. The readout circuit is subject to changes due to aging and operating conditions over time, but the readout values from the reference pixels are used to adjust the readout values from the active pixels to compensate for the unwanted effects.

System and methods for aging compensation in AMOLED displays

Disclosed is a circuit and technique to determine the temperature of an AMOLED display in order to calibrate programming data signals. The temperature of selected pixels of a plurality of pixels in an AMOLED display is measured via one of several disclosed methods. A thermal sensor for the selected pixels may be used. A measurement of output voltage data may be used to estimate temperature. A finite element analysis model may be used based on consumed power of the selected pixel. The temperature data for the selected pixel is then interpolated to the neighboring non-selected pixels to estimate the temperature of those pixels.

System and methods for thermal compensation in AMOLED displays

A system and method for determining and applying characterization correlation curves for aging effects on an organic light organic light emitting device (OLED) based pixel is disclosed. A first stress condition is applied to a reference pixel having a drive transistor and an OLED. An output voltage based on a reference current is measured periodically to determine an electrical characteristic of the reference pixel under the first predetermined stress condition. The luminance of the reference pixel is measured periodically to determine an optical characteristic of the reference pixel. A characterization correlation curve corresponding to the first stress condition including the determined electrical and optical characteristic of the reference pixel is stored. Characterization correlation curves for other predetermined stress conditions are also stored based on application of the predetermined stress conditions on other reference pixels. The stress condition of an active pixel is determined and a compensation voltage is determined by correlating the stress condition of the active pixel with the curves of the predetermined stress conditions.

System and methods for extracting correlation curves for an organic light emitting device

A local priority-based scanning scheme that focuses scanning to areas of a display panel whose measured characteristics are under continuous change (e.g., aging or relaxation). The algorithm identifies areas or regions needing compensation, using a current measurement from a single pixel in an area as a candidate to determine whether the rest of the region needs further compensation. The algorithm thus detects newly changed areas quickly, focusing time-consuming measurements on those areas that need high attention. Optionally, neighboring pixels sharing the same state (e.g., aging or overcompensated) as the measured pixel can be adjusted automatically given the likelihood that the neighboring pixels will also require compensation if the measured pixel needs compensation.

Adaptive feedback system for compensating for aging pixel areas with enhanced estimation speed

A method of voltage-programming a pixel circuit in a display panel to remove, before programming the pixel circuit, effects due to short-term effects such as caused by fast light transitions or effects due to previous pixel circuit measurements such as charge trapping. During a resetting cycle, the pixel circuit is programmed with a reset voltage value corresponding to a maximum or a minimum voltage value. Then, during a calibration cycle, the pixel circuit is programmed with a calibration voltage based on previously extracted data for the pixel circuit, a pixel current of the pixel circuit is measured, and the extracted data for the pixel circuit is updated based on the measured pixel current. Then, the pixel circuit is programmed with a video data that is calibrated with the updated extracted data. The pixel circuit is finally driven according to the programmed video data and emits a commensurate amount of light.

Resetting cycle for aging compensation in AMOLED displays

Methods and systems to provide baseline measurements for aging compensation for a display device are disclosed. An example display system has a plurality of active pixels and a reference pixel. Common input signals are provided to the reference pixel and the plurality of active pixels. The outputs of the reference pixel is measured and compared to the output of the active pixels to determine aging effects. The display system may also be tested applying a first known reference current to a current comparator with a second variable reference current and the output of a device under test such as one of the pixels. The variable reference current is adjusted until the second current and the output of the device under test is equivalent of the first current. The resulting current of the device under test is stored in a look up table for a baseline for aging measurements during the display system operation. The display system may also be tested to determine production flaws by determining anomalies such as short circuits in pixel components such as OLEDs and drive transistors.

A system and method for determining and applying characterization correlation curves for aging effects on an organic light organic light emitting device (OLED) based pixel is disclosed. A first stress condition is applied to a reference pixel having a drive transistor and an OLED. An output voltage based on a reference current is measured periodically to determine an electrical characteristic of the reference pixel under the first predetermined stress condition. The luminance of the reference pixel is measured periodically to determine an optical characteristic of the reference pixel. A characterization correlation curve corresponding to the first stress condition including the determined electrical and optical characteristic of the reference pixel is stored. The stress condition of an active pixel is determined and a compensation voltage is determined by correlating the stress condition of the active pixel with curves of the predetermined stress conditions.

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Kitchener, Canada

Javid Jaffari