Columbia University

Cornell University

Jason Yosinski

Hod Lipson

Michael A Gore

Alan Chad DeChant

Tyr Wiesner-Hanks

Ethan Stewart

Rebecca J Nelson

Siyuan Chen

Disclosed are devices, systems, apparatus, methods, products, and other implementations, including a method to detect pattern characteristics in target specimens that includes acquiring sensor data for the target specimens, dividing the acquired sensor data into a plurality of data segments, and generating, by multiple neural networks that each receives the plurality of data segments, multiple respective output matrices, with each data element of the multiple respective output matrices being representative of a probability that corresponding sensor data of a respective one of the plurality of data segments includes a pattern characteristic in the target specimens. The method further includes determining by another neural network, based on the multiple respective output matrices generated by the multiple neural networks, a presence of the pattern characteristic in the target specimens.

Methods and systems for pattern characteristic detection

Growing community of inventors

New York, NY, United States of America

Jason Yosinski