Sandia Corporation

Leland Stanford Junior University

National Technology & Engineering Solutions of Sandia, LLC

Jason W Wheeler

Brandon R Rohrer

Kurt W Larson

Hyrum Anderson

Joan Savall

Paul Charles Galambos

Mark R Cutkosky

Barry Louis Spletzer

Clinton G Hobart

James Bradley Aimone

Richard C Givler

Conrad D James

Tu-Thach Quach

Deepesh K Kholwadwala

Jovana Helms

Arun F Rodrigues

Karlin Y Bark

A method and apparatus for monitoring a volatile memory in a computer system. Samples of compressed data from locations in the volatile memory in the computer system are read. Data in the volatile memory is reconstructed using the samples of compressed data. The data is an image of the volatile memory. The image enables determining whether an undesired process is present in the volatile memory.

Malicious activity detection in a memory

Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.

Sparse sampling and reconstruction for electron and scanning probe microscope imaging

Various technologies described herein pertain to compressive sensing electron microscopy. A compressive sensing electron microscope includes a multi-beam generator and a detector. The multi-beam generator emits a sequence of electron patterns over time. Each of the electron patterns can include a plurality of electron beams, where the plurality of electron beams is configured to impart a spatially varying electron density on a sample. Further, the spatially varying electron density varies between each of the electron patterns in the sequence. Moreover, the detector collects signals respectively corresponding to interactions between the sample and each of the electron patterns in the sequence.

Fast electron microscopy via compressive sensing

The tactile feedback device of the preferred embodiments includes at least one skin contact pad; at least one actuator designed to move the at least one skin contact pad and attached to the at least one skin contact pad in a manner suitable to allow the actuator to move the at least one skin contact pad; a processor coupled to the actuator that executes a control logic and functions to control the movements of the at least one actuator; the control logic functions to determine the motions of the at least one actuator and is designed to move the at least one actuator in a manner that stretches the skin of the user. The tactile feedback device of the preferred embodiments has been designed to provide feedback to a user in a way that provides the user with information regarding a task that they are performing. The tactile feedback device of the preferred embodiments, however, may be used for any suitable purpose.

Skin stretch tactile feedback device

Footwear comprises a sole and a plurality of sealed cavities contained within the sole. The sealed cavities can be incorporated as deformable containers within an elastic medium, comprising the sole. A plurality of micro electro-mechanical system (MEMS) pressure sensors are respectively contained within the sealed cavity plurality, and can be adapted to measure static and dynamic pressure within each of the sealed cavities. The pressure measurements can provide information relating to the contact pressure distribution between the sole of the footwear and the wearer's environment.

Micro electro-mechanical system (MEMS) pressure sensor for footwear

Growing community of inventors

Albuquerque, NM, United States of America

Jason W Wheeler