Keysight Technologies, Inc.

Jason Swaim

Michael Thomas McTigue

Edward Vernon Brush

Daniel A Garcia

A probe is connectable to a test instrument for measuring signals of a DUT, where the probe includes a probe head that includes multiple leads configured to connect to signal probe points of the DUT, and a sensor connected between two of the leads; at least one probe output configured to connect to the test instrument; a current detection circuit configured to detect current of the DUT through the sensor, and to provide a detected current signal; a voltage detection circuit configured to detect voltage of the DUT between the sensor and ground, and to provide a detected voltage signal; a combiner configured to combine the detected current signal and the detected voltage signal, and to provide a power signal indicating power of the DUT; and switches configured to selectively output at least one of the detected current signal, the detected voltage signal, and the power signal.

Power probe including sensor for detecting current and voltage signals

A handheld differential contact probe includes a housing configured to be held in a hand of a user, a pair of probe arms carried by the housing, and a pair of opposing probe tip assemblies each carried by one of the respective probe arms and each having a probe tip circuit coupled to a probe tip at a distal end thereof. A probe tip span adjustment mechanism is carried by the housing and coupled to the pair of probe arms, and configured to adjust a span between the probe tips. A ground path mechanism is coupled between the probe tip circuits of the respective probe tip assemblies, and includes a pair of curved conductive ribbon springs each coupled at an outer end thereof to a respective probe tip circuit, and each curved conductive ribbon spring slidably engaging each other at a respective inner end thereof.

Differential contact probe including ground mechanism and associated methods

A miniature probe for measuring small voltage signals of a DUT includes a probe body having a flexible substrate and signal transmission lines running a longitudinally, and a first probe connection circuit located at a first end of the probe body and including exposed wires, SMT components coupled between the exposed wires and the signal transmission lines, respectively, and a local mechanical stiffener mounted adjacent the SMT components. The wires are connectable to the DUT for receiving the voltage signals. The probe further includes a second probe connection circuit located at a second end of the probe body, and including transmission line connectors coupled to the signal transmission lines, respectively, and a bent portion of the flexible substrate between the probe body and the transmission line connectors. The bent portion enables the transmission line connectors to exit the probe substantially axially, relative to the longitudinal length of the probe body.

Miniature test probe

A single-ended test probe includes a probe body such as a coaxial cable, a signal tip integral with the core (signal conductor), to ground arm having a ground tip and mounted to the coaxial cable, and an electrically conductive ground member projecting outside the coaxial cable and electrically conductively connecting the ground arm to the shield (ground conductor) of the coaxial cable. The ground member may be located closer to the end of the cable than the location at which the ground arm is mounted to the cable to minimize inductance in the connection between the probe and a device under test. The ground member may also be a cam by which the span between the ground and signal tips can be adjusted. Also, the test probe may include a second ground arm that is detachable connectable to the probe body independently of the first.

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Colorado Springs, CO, United States of America

Jason Swaim