Roper Scientific, Inc.

Princeton Instruments

Jason McClure

William Edward Asher

Michael Alan Case

Embodiments include methods that may be used to optically obtain the precise three-dimensional location of multiple objects from one or more two dimensional images. An optical point spread function having a transverse shape which varies with axial distance may be implemented to obtain depth information. The transverse variation in the PSF with depth may be produced using a cylindrical lens. The objects may be imaged by a focal plane array detector. One or more 2D images may be used to find the 3D location of the objects using sparse signal reconstruction methods.

System and method for optical three-dimensional particle localization

An apparatus and method are disclosed for producing spectrographic images free of SI, SII, and SIII field aberrations. The apparatus includes a focusing element placed at a distance from a dispersing element equal to the radius of curvature of the focusing element. The apparatus further includes at least one correcting plate for adding or subtracting abberations.

Anastigmatic imaging spectrograph

A backside-illuminated image sensor is disclosed having improved quantum efficiency (QE) in the near infrared wavelengths (NIR: 750-1100 nm) with minimal optical interference fringes produced by multiple reflected rays within the photosensitive Si region of the sensor, which may be a charge-coupled device, a complementary metal oxide sensor or an electron-multiplication sensor. The invention comprises a fringe suppression layer applied to the backside surface of the photosensitive Si region of a detector (Si substrate) whereby the fringe suppression layer functions in concert with the Si substrate to reduce the occurrence of interference fringes in the NIR while maintaining a high QE over a broad range of wavelengths (300-1100 nm). The combination of a fringe suppression layer applied to a Si substrate provides a new class of back illuminated solid state detectors for imaging.

Solid state back-illuminated photon sensor

Disclosed is a method for calibrating optical spectrographs, and in particular optical spectrographs having focal plane array detectors. The method comprises the steps of detecting a spectrum of a known source, referencing a table of known spectral wavelengths and relative intensities, and deriving a spectrograph model based on the spectrograph's physical properties to approximate the observed spectrum, wherein non-linear optimization techniques refine the theoretical model parameters, thereby minimizing the residual difference between observed and calculated spectral intensities in an iterative process producing a set of physical model parameters that best describe the modeling spectrograph for calibration of subsequent spectral acquisitions.

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Acton, MA, United States of America

Jason McClure