Agilent Technologies, Inc.

Jason M Horn

David E Root

Daniel B Gunyan

Jianjun Xu

Loren C Betts

Masaya Iwamoto

A method and system are provided for generating a nonlinear simulation model of a device under test (DUT). The method and system include receiving large-signal nonlinear waveform data based on responses of the DUT to input signals, determining a set of first dynamical variables and a set of second dynamical variables from the nonlinear waveform data, calculating values of second dynamical variables, providing nonlinear constitutive relations as functions of the first dynamical variables and the calculated values of the second dynamical variables, and compiling the nonlinear simulation model of the DUT using the identified nonlinear constitutive relations.

Method and system for generating nonlinear simulation model

A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output having at least one unwanted spectral component. The method includes the further step of using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition.

Method and apparatus for determining a response of a DUT to a desired large signal, and for determining input tones required to produce a desired output

The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define 'large-signal S-parameters') with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.

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Santa Rosa, CA, United States of America

Jason M Horn