Oracle America, Inc.

Oracle International Corporation

Jason M Hart

Robert Paul Masleid

Ali Vahidsafa

Heechoul Park

Zhirong Feng

The described embodiments provide a configurable clock circuit. The clock circuit includes a control and enable circuit and a clock distribution circuit. During operation, when a signal on an enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a clock mode, the control and enable circuit generates an enable signal on a control output to enable a signal on a clock input to propagate through the clock distribution circuit to the clock output. Alternatively, when a signal on the enable input to the control and enable circuit is asserted and the control and enable circuit is configured in a pulse mode, the control and enable circuit generates a pulsed control signal on the control output to control a length of a pulse generated from the clock input on a clock output by the clock distribution circuit.

Integrated pulse-control and enable latch circuit

A flop circuit is disclosed. The flop circuit includes an input circuit configured to hold a logic value of an input signal received on its input node. The flop circuit further includes a storage circuit configured to, responsive to a pulse clock transitioning to a first logic level, receive and store the logic value and a complement of the logic value. A transfer circuit is coupled between the input circuit and the storage circuit, wherein the transfer circuit is configured to transfer the logic value from the input circuit to the storage circuit responsive to the pulse clock transitioning to the first logic level. The transfer circuit includes a first float node and a second float node and is configured such that at least one of the float nodes is floating during a portion of the operational cycle of the flop circuit.

Min-time hardended pulse flop

A SRAM (Static Random Access Memory) macro test flop circuit includes a flip-flop circuit, a scan control circuit, and an output buffer circuit. The flip-flop circuit includes a master latch circuit and a slave latch circuit. The master latch circuit includes a master feed-back circuit including a master storage node and a master feed-forward circuit. The slave latch circuit includes a slave feed-back circuit including a slave storage node and a slave feed-forward circuit driven from the master latch. The scan control circuit includes a scan slave feed-forward circuit, a scan latch circuit, and a scan driver circuit driven by the scan feed-back circuit. The scan latch circuit includes a scan feed-back circuit comprising a scan storage node and a scan feed-forward circuit driven from the slave latch. The output buffer circuit includes a master driver driven from master latch circuit and a slave driver driven from slave latch circuit.

SRAM macro test flop

A latch circuit includes a feed-forward circuit, a keeper circuit, and a feed-back circuit. The feed-forward circuit includes a first-inverting-stage with a first input and a first output, wherein the first-inverting-stage comprises a first clocked device, and a second-inverting-stage with a second input and a second output, wherein the second-inverting-stage comprises a second clocked device, and a keeper circuit. The first output is operatively connected to the second input. The keeper circuit is operatively connected to the first output, and the keeper circuit is driven from the second output. The feed-back circuit includes a third-inverting-stage with a third input and a third output, wherein the third input is operatively connected to the second output, and a fourth-inverting-stage with a fourth input and a fourth output. The fourth input is operatively connected to the third output. The fourth output is connected to the third input to form a storage node.

Latch with clocked devices

A clock generating circuit includes a source clock, a first clock generated from the source clock through a first header, a second clock generated from the source clock through a second header and an inverter, wherein the second clock is out of phase with respect to the first clock, a first delayed falling edge clock, wherein the first delayed falling edge clock corresponds to the first clock with a first delayed falling edge, and a second delayed falling edge clock, wherein the second delayed falling edge clock corresponds to the second clock with a second delayed falling edge. The first delayed falling edge clock is generated from a first leading edge path and a first falling edge path, both originating from the source clock, that are inputted to a first delay chain.

Precision falling edge generator

A flip-flop or other state circuit that includes level-shifting functionality. In connection with a flip-flop, embodiments include an inverter circuit element that has a data input line as its input and a data complement line as its output. The inverter resides in voltage domain that is lower than the voltage domain associated with remainder of the flip-flop.

Growing community of inventors

Hayden, ID, United States of America

Jason M Hart