Raytheon Company

Jason L Wheeler

Stephen T Fasolino

Joshua Ng

Brian J Mercer

A system includes a component inspection system having a radiation source configured to generate radiation and a radiation detector configured to detect the radiation after the radiation passes through components to be inspected. The system also includes a fixture configured to receive multiple reels that are each configured to receive a tape in or on which the components are located. The fixture includes a base configured to be secured to a support, a shaft, one or more motors mounted to the shaft and configured to rotate the reels, and one or more joints coupling the shaft and base. The one or more joints are configured to allow (i) rotation of the shaft about a longitudinal axis of the shaft to change an orientation of the shaft with respect to the base and (ii) rotation of the shaft to change a direction at which the shaft extends away from the base.

Fixture to support reel-to-reel inspection of semiconductor devices or other components

An accessory component for a standardized component without a power source output is provided. The standardized component includes a communication device. The accessory component includes a data input port and a power input port. The data input port is configured to receive a data signal from the standardized component. The power input port is configured to receive a transmit signal from the communication device. The accessory component is configured to process the data signal using power provided by the transmit signal.

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Murphy, TX, United States of America

Jason L Wheeler