Atmel Corporation

Intel Corporation

Micron Technology Incorporated

Jason Guo

Vishal Sarin

Jung Sheng Hoei

Dzung Huu Nguyen

Jonathan Pabustan

William Saiki

Qiang Tang

Dean K Nobunaga

Vikram Kowshik

Steven J Schumann

Edward S Hui

Sai Kai Tsang

Fai Ching

Kris Li

Ali Ghalam

Yolanda Yuan

Method, system and apparatus for detecting voltage ramping to a target voltage level in steady state, comprising, ramping a regulated voltage to a steady state target voltage for an operation of a load circuit, the steady state target voltage being a voltage level that enables the load circuit to perform the operation, generating an output signal indicating that the regulated voltage has reached the target voltage and generating a ready signal responsive to detecting the output signal.

Voltage ramping detection

A method and apparatus that controls a peak-current condition in a multi-die memory, such as a solid-state drive, by determining by at least one die of the multi-die memory whether a subsequent memory operation is a high-current memory operation, such as an operation to enable a charge pump of the die, an operation to charge a bit line of the die, or a program/erase loop operation, or a combination thereof. The die enters a suspended-operation mode if the subsequent memory operation is determined to be a high current memory operation. Operation is resumed by the die in response to a resume operation event, such as, but not limited to, a command specifically address to the die, an indication from another die that a high-current memory operation is complete. Once operation is resumed, the die performs the high-current memory operation.

Auto-suspend and auto-resume operations for a multi-die NAND memory device to reduce peak power consumption

Methods and apparatus are disclosed, such as those involving a flash memory device that includes a memory block. The memory block includes a plurality of data lines extending substantially parallel to one another, and a plurality of memory cells. One such method includes erasing the memory cells; and performing erase verification on the memory cells. The erase verification includes determining one memory cell by one memory cell whether the individual memory cells coupled to one of the data lines have been erased. The method can also include performing a re-erase operation that selectively re-erases unerased memory cells based at least partly on the result of the erase verification.

Methods of erase verification for a flash memory device

A sense amplifier circuit comprises first and second cross-coupled inverters to produce a latch with first and second power supply nodes. The first latch power supply node couples a first power supply potential to the latch when the sense amplifier is operating in a read-out mode. The second latch power supply node couples a second power supply potential to the latch when the sense amplifier operates in the read-out mode. The first and second latch power supply nodes are further configured to couple an equalization potential to the first and second power supply nodes when the latch is operating in an equalization mode.

Sense amplifier for flash memory device

A decoding system for multi-plane memories routes address information corresponding to distinct memory access operations to the designated planes. The system includes an array of functional registers dedicated to random access read, burst read, program, erase, and erase-suspend program operations. Plane selector blocks for each plane receive the address outputs from all of the registers and plane function select logic controls the routing in accord with memory access commands for specified planes. Simultaneous operations of different type in different planes and nested operations in the same plane are possible.

Functional register decoding system for multiple plane operation

In a non-volatile memory, a programming cycle consists of the following phases: high voltage charging up, programming pulse, and discharge. The actual programming process only takes place in the programming pulse phase. Several break points are defined relative to elapsed time and introduced in the programming pulse phase. Upon receiving a suspend request, the programming operation will advance to the next break point, then discharge the high programming voltage and go to a suspend state. A separate counter is used to monitor the break points so that elapsed non-programming time can be deducted from the total programming pulse time when the programming operation is resumed. By doing so, the device can handle frequent suspend and resume requests. Since the total time duration in the programming pulse phase is equal for the programming operation with and without suspend and resume requests, the programming proceeds efficiently to completion.

Suspend-resume programming method for flash memory

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San Jose, CA, United States of America

Jason Guo