Apple Inc.

Broadcom Corporation

Ikanos Communications, Inc.

Jason C Hu

Sumant Ranganathan

Manu Agarwal

Shahrooz Shahparnia

Hyunwoo Nho

Martin Paul Grunthaner

Jie Won Ryu

ByoungSuk Kim

Kyung Wook Kim

Christian M Sauer

Albert Lin

Kwang Soon Park

Myungjoon Choi

Dhaval Chandrakant Patel

Echere Iroaga

Jason N Gomez

Qasem Aldrubi

Vehbi Calayir

Xinyu Yu

Yao Shi

James E Brown

Sylvain Flamant

Jing Yang

Brian H Knabenshue

Blain Kennedy

Evan P Donoghue

An electronic display may include a touch sensing system configured to perform touch sensing in an active area of the electronic display and display driver circuitry configured to program display pixels of the active area to emit light. The electronic display may also include the active area. The active area may include a first portion and a second portion that are at least partially electrically separated. The display driver circuitry may program the display pixels in the first portion while the touch sensing circuitry may perform touch sensing in the second portion.

Split display driver circuitry to mitigate touch sensing system interaction

A touch sensor panel is disclosed. The touch sensor panel includes a first layer including a plurality of electrodes of a first type that are coupled to respective traces and are configured to operate as touch sensing electrodes during a first time period. The touch sensor panel also includes a second layer including a plurality of electrodes of a second type overlapping with the respective traces of the electrodes of the first type. The electrodes of the second type are configured to operate as guard electrodes for the respective traces of the electrodes of the first type during the first time period and operate as touch sensing electrodes during a second time period.

Touch sensor panel architecture with multiple sensing mode capabilities

Disclosed herein are structures, devices, and methods for sensing physical parameters, such as strain in a surface, using resistance-based parameter sensors and current sensing. An applied strain can cause a differential change in one or more currents from two resistors configured in parallel in the sensor. Strain can be inferred from a ratio of the difference of the two currents to a sum of the two currents. These structures and methods can be adapted to measure strain or other parameters using an array of sensors, with common voltages applied to rows of the array, and currents being summed in column in the array so that fewer receivers are needed.

Row column architecture for strain sensing

Noise in sensor panel measurements can be reduced using a common pixel correction algorithm. Noise can be introduced into touch or force sensor panel measurements, for example, by circuitry of a transmit (Tx) section or a receive (Rx) section coupled to one or more sensing nodes of a sensor panel. For example, a digital-to-analog converter in the transmit section or an analog-to-digital converter in the receive section can introduce low-frequency correlated noise. Additionally, transmit and receive sections can introduce uncorrelated noise into the system. Reference nodes, coupled between Tx and Rx sections, can sense correlated and uncorrelated noise from the Tx and Rx sections. The noise measured at reference nodes can be subtract from signals measured at other sensing nodes coupled to the same Rx channel. The measurement at the reference node can be scaled using a scaling parameter to account for differences between reference nodes and sensing nodes.

Common pixel correction for sensor panels

Beaded toy

Peak-to-average ratio reduction is achieved by detecting peaks in an original analog signal that exceed a given threshold. Segments of the original analog signal containing such peaks are treated (e.g., by attenuation) and a composite analog signal is assembled that includes treated and untreated segments of the original analog signal. The composite analog signal is processed to perform analog-to-digital conversion to generate a composite digital signal. Segments of the composite digital signal corresponding to the treated segments of the original analog signal are reverse-treated or otherwise treated again to undo treatment of the segments of the original analog signal. A final output digital signal is generated that corresponds to the original analog signal in digital form.

Method and apparatus for peak-to-average ratio reduction

An analog-to-digital converter (ADC) includes reference charge cancellation features to at least partially offset a voltage distortion on a bypass capacitor of a reference buffer due to a voltage reference hit taken by a switched capacitor bank with which the bypass capacitor is connected. The charge cancellation may be configured in logic to be input signal dependent because different resolved bits or transitions between resolved bits may cause different amounts of voltage reference hits. By adjusting the bypass capacitor in response to each of at least some of the reference hits while resolving a word of bits, the reference voltage signal provided by the bypass capacitor undergoes far less settling, remaining more stable and linear for a more accurate reference voltage. Furthermore, a smaller capacitor may be used for the bypass capacitor, reducing power consumption and area on chip.

Reference charge cancellation for analog-to-digital converters

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Palo Alto, CA, United States of America

Jason C Hu