Tera-print, Llc.

Jared A Magoline

Andrey Ivankin

Cantilever-Free Scanning Probe Lithography (CF-SPL) techniques are used to enable generation of 1-, 2-, 3-, and 4-D information containing patterns in a mask-free manner that, in turn, enables instantaneous change of pattern design.

Fabrication of micro/nanoscale barcodes using cantilever-free scanning probe lithography

Disclosed embodiments provide an electrical contact alignment strategy for leveling an array of probes, pens, tips, etc., in relationship to a substrate, for example, wherein a plurality of independent electrical circuits are formed by configuring regions of the array and substrate regions to be partially conductive and connected to opposite electrodes or vice versa.

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Fond du Lac, WI, United States of America

Jared A Magoline