University of Rochester

Perkinelmer Health Sciences Canada, Inc.

Jannick P Rolland-Thompson

Aaron Bauer

Di Xu

Romita Chaudhuri

Nick Vamivakas

Fei Cheng

Daniel Nikolov

Dennis Yates

Changsik Yoon

Mahsa Farsad

A detector system for Fourier spectroscopy such as a spectral domain optical coherence tomography instrument includes a diffractive optic for diffracting the interfering light into angularly dispersed wavenumbers, a prism for reduces a nonlinear angular dispersion among the wavenumbers, and a focusing optic for converting the angularly dispersed wavenumbers from the prism into spatially distributed wavenumbers along a detector having an array of pixels. A field lens between the focusing optic and the detector has a freeform surface for more evenly distributing the wavenumbers along the array of pixels.

Absolute linear-in-k spectrometer

A see-through reflective optical device includes: a reflective metasurface configured for a targeted design optical wavelength, wherein the reflective metasurface comprises a sub-wavelength periodic arrangement of meta-atoms formed by patterned isolated gap surface plasmon (GSP) resonators, where the patterned isolated GSP resonators comprise a patterned optically thin metal layer for the design wavelength, an optically thick metal layer for the design wavelength, and an insulator layer between the patterned optically thin metal layer and the optically thick metal layer; and an array of apertures of random positions and diameters greater than the targeted design wavelength formed through the reflective metasurface providing a designed percentage of light transparency through the reflective metasurface. The reflective metasurface of the see-through reflective optical device may comprise, e.g., a reflective diffraction grating metasurface, and may be used as a combiner element surface in a near eye display assembly.

See-through reflective metasurface

An echelle spectrometer includes a slit opening for incoming light, a collimator which collimates a diverging beam of light generated through the slit, a reflective echelle grating which disperses the collimated light along a first dimension; a cross-disperser which disperses at least a portion of the collimated light in a second dimension orthogonal to the first dimension to create a two-dimensional spectral field-of-view; and an imaging system which images the two-dimensional spectral field-of-view onto a detector; wherein the imaging system comprises primary, secondary, and tertiary tilted mirrors, where each of the tilted mirrors comprises a freeform, rotationally non-symmetric surface shape.

Compact freeform echelle spectrometer

Single-shot, adaptive metrology of rotationally variant optical surfaces, such as toroids, off-axis conies and freeform surfaces. An adaptive interferometric null test uses a high definition liquid crystal phase-only spatial light modulator (SLM) as the reconfigurable null element, on which a simulated nulling phase function is encoded, based on the specifications of the surface under test to generate a null interferogram. The power component of the surface sag is nulled by system design, not the SLM, enabling the SLM to fully compensate the residual departure without the need to tilt the optic or use a custom Offner-null. By wrapping the phase function at multiples of 2*pi radian, the upper limit in sag of the optic under test is theoretically removed.

Single-shot, adaptive metrology of rotationally variant optical surfaces using a spatial light modulator

A cascaded interferometric system for Fourier domain optical coherence tomography (OCT) in which the output of one sub-system interferometer is directed through a second sub-system interferometer for performing the Fourier transform in hardware.

Cascade Fourier domain optical coherence tomography

Optical coherence tomography metrology systems with two highly telecentric objective lenses wherein one or both telecentric objectives can be arranged in a pseudo-bistatic configuration. One featured telecentric objective has a large scanning field of view relevant for broadband laser scanning applications where low uncertainty measurements are desired. Another featured telecentric objective has a large image space NA relevant as a standalone microscope objective or as a probing objective for optical coordinate measurement machines.

Growing community of inventors

Seneca Falls, NY, United States of America

Jannick P Rolland-Thompson